Trinamix Gmbh

Patrick Schindler

Peter Schillen

Christian Lennartz

Robert Send

Ingmar Bruder

Michael Eberspach

Christian Bonsignore

Lars Diesselberg

Jakob Unger

Friedrich Schick

Christoph Lungenschmied

Heiko Hengen

Christian Schildknecht

Sebastian Valouch

Wilfried Hermes

Celal Mohan Oeguen

Benjamin Rein

Stefan Hengen

Thomas Ohmer

Andre Schmidt

Peter Fejes

Christopher Hahne

Ruben Huehnerbein

Erwin Thiel

Stephan Irle

Benjamin Guthier

Edgar Matevosjan

Oili Pekkola

Hamid Muhammed Hamed

Dimitri Butov

Mark Prediger

Celal Mohan ÖGÜN

Disclosed herein is a detector for determining at least one material property of at least one object. The detector includes

Enhanced material detection by stereo beam profile analysis

Described herein is a detector for determining a position of at least one object. The detector includes at least one sensor element having a matrix of optical sensors, the optical sensors each having a light-sensitive area, wherein the sensor element is configured to determine a reflection image of the object. The detector also includes an evaluation device configured to select a reflection feature of the reflection image, and determine a distance estimate of the selected reflection feature of the reflection image by optimizing at least one blurring function fa, wherein the distance estimate is given by a longitudinal coordinate z and an error interval±ε. The evaluation device is adapted to determine at least one displacement region in at least one reference image corresponding to the distance estimate, and to match the selected reflection feature with at least one reference feature within the displacement region.

Detector for determining a position of at least one object

Disclosed herein is a method for authenticating a user of a mobile device. The method includes:

Method for authenticating a user of a mobile device

Described herein are systems including a structured light projector, a semiconductor detector, and a processor. Also described herein is a non-transitory computer readable medium storing executable instructions. The systems and non-transitory computer readable medium are configured to output a signal including information related to the classification of an object.

Detector for identifying at least one material property

Disclosed herein is a display device including

Depth measurement through display

Described herein is a detector for identifying at least one material property m. The detector includes at least one sensor element including a matrix of optical sensors, the optical sensors each having a light-sensitive area. The sensor element is configured for recording at least one reflection image of a light beam originating from at least one object. The detector includes at least one evaluation device configured for determining the material property m by evaluation of at least one beam profile of the reflection image and evaluation of a material feature φ2m.

Described herein is a detector for identifying at least one material property m. The detector includes at least one sensor element including a matrix of optical sensors, the optical sensors each having a light-sensitive area. The sensor element is configured for recording at least one reflection image of a light beam originating from at least one object. The detector includes at least one evaluation device configured for determining the material property m by evaluation of at least one beam profile of the reflection image and evaluation of a material feature ϕ2m.

Disclosed herein is a detector for determining a position of at least one object. The detector includes at least one projector for illuminating the object, at least one sensor element, and at least one evaluation device.

Illumination pattern for object depth measurement

A detector for determining a position of at least one object, the detector including:

Auto calibration from epipolar line distance in projection pattern

A method for determining a depth map of at least one object, the method including:

Shape-from-shading

Disclosed herein is a display device including an illumination source for projecting an illumination pattern including a plurality of illumination features on a scene; an optical sensor for determining a first image including a plurality of reflection features; a translucent display, where the illumination source and the optical sensor are placed in a direction of propagation of the illumination pattern in front of the display; and an evaluation device configured for evaluating the first image by identifying and sorting the reflection features with respect to brightness, each reflection feature including a beam profile, determining a longitudinal coordinate for each reflection feature by analyzing their beam profiles, unambiguously matching reflection features with corresponding illumination features using the longitudinal coordinate classifying a reflection feature as a real feature or a false feature, rejecting the false features, and generating a depth map for the real features using the longitudinal coordinate.

Described herein is a detector for identifying at least one material property m. The detector includes at least one sensor element including a matrix of optical sensors, the optical sensors each having a light-sensitive area. The sensor element is configured for recording at least one reflection image of a light beam originating from at least one object. The detector includes at least one evaluation device configured for determining the material property by evaluation of at least one beam profile of the reflection image.

Described herein is a detector for determining a position of an object. The detector includes a sensor element having a matrix of optical sensors, wherein the sensor element is configured to determine a reflection image. The detector also includes an evaluation device configured to select a reflection feature of the reflection image at a first image position in the reflection image, determine a longitudinal coordinate z of the selected reflection feature by optimizing a blurring function f, and determine a reference feature in a reference image at a second image position in the reference image corresponding to the reflection feature. The reference image and the reflection image are determined at two different spatial configurations, wherein the spatial configurations differ by a relative spatial constellation, wherein the evaluation device is configured to determine the relative spatial constellation from the longitudinal coordinate z and the first and the second image positions.

Described herein is a method for calibrating a detector including at least one camera and at least one projector. The projector is configured for illuminating at least one target with at least one predefined illumination pattern including a plurality of illumination features. The camera has at least one sensor element having a matrix of optical sensors, the optical sensors each having a light-sensitive area, where each optical sensor is designed to generate at least one sensor signal in response to an illumination of its respective light-sensitive area by a light beam propagating from the target to the camera. The target includes at least one first target and at least one second target. The first target and the second target have a predefined fixed relative distance. The target is positioned at a pre-defined distance from the detector.

One shot calibration

Described herein is a detector for determining a position of at least one object. The detector includes at least one sensor element having a matrix of optical sensors, the optical sensors each having a light-sensitive area, wherein the sensor element is configured to determine a reflection image of the object. The detector also includes an evaluation device configured to select a reflection feature of the reflection image, and determine a distance estimate of the selected reflection feature of the reflection image by optimizing at least one blurring function f, wherein the distance estimate is given by a longitudinal coordinate z and an error interval ±ε. The evaluation device is adapted to determine at least one displacement region in at least one reference image corresponding to the distance estimate, and to match the selected reflection feature with at least one reference feature within the displacement region.

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Ludwigshafen, Germany

Patrick Schindler