Corning Incorporated

Patrick Ryan Pruden

Benedict Osobomen Egboiyi

Ananthanarayanan Subramanian

James Edward Morrison, Jr

A test apparatus comprises a probe movably mounted relative to a carrier. The probe comprises an end portion with a surface area of about 5 mmor less. The test apparatus can be used in methods of determining a crush strength of an edge of a substrate. Methods can comprise aligning the probe with a test location of the substrate at a predetermined angle relative to a probe axis. Methods can further comprise applying a mechanical force to the test location with the probe in the direction of the probe axis. Also, methods can comprise increasing the mechanical force applied by the probe until the substrate cracks or a predefined force applied by the probe is reached. Based on the mechanical force applied by the probe, a crush strength of an edge can be determined.

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Corning, NY, United States of America

Patrick Ryan Pruden