Intel Corporation

Patrick Nardi

Manish Dubey

Kelly P Lofgreen

Rajendra C Dias

John Harper

Ravindranath Vithal Mahajan

John Stephen Guzek

Carl L Deppisch

Javier Soto Gonzalez

Srikant Nekkanty

Pramod Malatkar

Robert Starkston

Dingying David Xu

Phil Geng

Rajen S Sidhu

Kyle Yazzie

Syadwad Jain

Michael Aaron Schroeder

Zhizhong Tang

Wei Hu

Malavarayan Sankarasubramanian

Prasanna Raghavan

Bamidele Daniel Falola

Leigh M Tribolet

Keith D Jones

Kevin Y Lin

Venkata Suresh R Guthikonda

Yang Jiao

Valery Ouvarov-Bancalero

Ravi Siddappa

James Mertens

Sanjoy Saha

Santosh Sankarasubramanian

John L Harper

David Woodhams

Embodiments disclosed herein include an electronic package. In an embodiment, the electronic package comprises a package substrate, and a die coupled to the package substrate. In an embodiment, the electronic package further comprises a stiffener on the package substrate surrounding the die. In an embodiment, the stiffener is a ring with one or more corner regions and one or more beams. In an embodiment, each beam is between a pair of corner regions, and the one or more corner regions have a first thickness and the one or more beams have a second thickness that is greater than the first thickness.

BGA stiffener attachment with low Eolife adhesive strength at high solder joint stress area generated from enabling load

A stiffener for an integrated circuit (IC) package assembly including an IC die electrically interconnected to a substrate. The stiffener is to be mechanically attached to the substrate adjacent to at least one edge of the IC die and have a coefficient of linear thermal expansion (CTE) exceeding that of the substrate. The stiffener may be an 'anti-invar' metallic alloy. Anti-invar alloys display “anti-invar” behavior where thermal expansion of the material is significantly enhanced relative to other compositions of the particular alloy system. A package stiffener may be a high-Mn steel, for example, such as ASTM International A128. In other examples, a package stiffener is a MnCuNi, FeNiMn, or FeNiCr alloy having an average CTE over a range of 25-100° C. of at least 18 ppm, and a room temperature modulus of elasticity of at least 120 GPa.

Integrated circuit die package stiffeners of metal alloys having exceptionally high CTE

Devices and methods disclosed herein can include a conductive foam having pores disposed within the conductive foam. The conductive foam can be compressible between an uncompressed thickness and a compressed thickness. The compressed thickness can be ninety-five percent or less of the uncompressed thickness. In one example, a filler can be disposed in the pores of the conductive foam. The filler can include a first thermal conductivity. The first thermal conductivity can be greater than a thermal conductivity of air.

Foam composite

An electronic package that includes a substrate and a die attached to the substrate. The electronic package further includes a stiffener that is attached to the substrate adjacent to the die. The stiffener is formed of a first layer made from one material and a second layer made from a different material.

Electronic package that includes multi-layer stiffener

An apparatus, comprising a first platform comprising a first working surface having a first non-planar portion; and a second platform comprising a second working surface having a second non-planar portion, wherein: the second working surface is opposite the first working surface, a distance between the first working surface and the second working surface is adjustable, the first non-planar portion comprises a first curved portion, and the second non-planar portion comprises a second curved portion opposite the first curved portion.

Constrained cure component attach process for improved IC package warpage control

Some embodiments relate to an electronic package. The electronic package includes a substrate and a die attached to the substrate. The electronic package further includes an underfill positioned between the die and the substrate due to capillary action. A support surrounds the die. The support provides the same beneficial fillet geometry on all die edges. Therefore, the support provides similar stress reduction on all die edges. Other embodiments relate to method of fabricating an electronic package. The method includes attaching a die to a substrate and inserting an underfill between the die and the substrate using capillary action. The method further includes placing a support around the die such that the support surrounds the die.

Electronic package and method of connecting a first die to a second die to form an electronic package

Techniques are disclosed for forming a package substrate with integrated stiffener. A panel of package substrates are provided. An adhesion layer is then formed on each package substrate of the panel of package substrates. A panel of stiffeners are then attached to the panel of package substrates by the adhesion layer, each stiffener corresponding to a respective package substrate. The panel of package substrates is then singulated into individual package substrates with integrated stiffeners. The stiffeners on the singulated package substrates include tabs that extend to the edges of the package substrates.

Panel level fabrication of package substrates with integrated stiffeners

Methods of forming a microelectronic packaging structure and associated structures formed thereby are described. Those methods may include forming a thermal interface material comprising a thermally conductive serpentine foil located between a first and a second interface material. The serpentine foil may be in a parallel position or a rotated position, in embodiments.

Methods of forming serpentine thermal interface material and structures formed thereby

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Scottsdale, AZ, United States of America

Patrick Nardi