Harvard College

Element Six Technologies Limited

Patrick Maletinsky

Mikhail D Lukin

Marko Loncar

Amir Yacoby

Michael S Grinolds

Nathalie De Leon

Brendan John Shields

Sungkun Hong

Yiwen Chu

Alastair Stacey

Ruffin Eley Evans

A sensing probe may be formed of a diamond material comprising one or more spin defects that are configured to emit fluorescent light and are located no more than 50 nm from a sensing surface of the sensing probe. The sensing probe may include an optical outcoupling structure formed by the diamond material and configured to optically guide the fluorescent light toward an output end of the optical outcoupling structure. An optical detector may detect the fluorescent light that is emitted from the spin defects and that exits through the output end of the optical outcoupling structure after being optically guided therethrough. A mounting system may hold the sensing probe and control a distance between the sensing surface of the sensing probe and a surface of a sample while permitting relative motion between the sensing surface and the sample surface.

Nanoscale scanning sensors

Growing community of inventors

Cambridge, MA, United States of America

Patrick Maletinsky