International Business Machines Corporation

Patrick M West, Jr

Jane Helen Bartik

Lisa Cranton Heller

Phil C Yeh

Donald W Schmidt

Damian Leo Osisek

John G Rell, Jr

James Raymond Cuffney

Eric M Schwarz

Khary J Alexander

Martin Recktenwald

Christian Jacobi

Timothy J Koprowski

Chung-Lung K Shum

Scott Barnett Swaney

Hans-Werner Tast

Michael Billeci

Willm Hinrichs

David Allan Webber

Bruce A Wagar

Donald G O'Brien

Timothy John Slegel

Christopher A Krygowski

Jonathan T Hsieh

Vimal M Kapadia

Jonathan S Nikfarjam

A central processing unit measurement facility is virtualized in order to support concurrent use of the facility by multiple guests executing within a virtual environment. Each guest of the environment has independent control over disablement/enablement of the facility for that guest.

Virtualization of a central processing unit measurement facility

A measurement sampling facility takes snapshots of the central processing unit (CPU) on which it is executing at specified sampling intervals to collect data relating to tasks executing on the CPU. The collected data is stored in a buffer, and at selected times, an interrupt is provided to remove data from the buffer to enable reuse thereof. The interrupt is not taken after each sample, but in sufficient time to remove the data and minimize data loss.

Managing a collection of data

Embodiments relate to a hardware circuit that is operable as a fixed point adder and a checksum adder. An aspect includes a driving of a multifunction compression tree disposed on a circuit path based on a control bit to execute one of first and second schemes of vector input addition and a driving of a multifunction adder disposed on the circuit path based on the control bit to perform the one of the first and second schemes of vector input addition.

Checksum adder

An apparatus for comparing strings comprises a first and a second set of input registers, a matrix of comparator circuits wherein rows of the matrix correspond to the first set of input registers and columns of the matrix correspond to the second set of input registers, a set of row control registers wherein each register corresponds to a row of the matrix of the comparator circuits, the matrix of comparator circuits configured to compare data provided by the first set of registers with data provided by the second set of registers according to the row control registers, and an error detection circuit configured to compare results from four comparator circuits corresponding to two adjacent rows and two columns of the matrix of comparator circuits. A method that invokes the above mentioned apparatus is also disclosed herein, along with a computer program product corresponding to the method.

String dataflow error detection

Embodiments relate to vectorized Galois field multiplication. An aspect includes an input of first and second input operands of equal sizes into a single hardware tree, a calculation of a predicted parity as a parity of the first input operand ANDed with a parity of the second input operand, a comparison of the predicted parity with a parity generated on a final result of a Galois field multiplication of the first and second operands and a raising of an error based on a mismatch between the predicted parity and the generated parity.

Vectorized Galois field multiplication

Embodiments relate to vectorized Galois field multiplication. An aspect includes a subdivision of first and second input operands into vector elements of equal sizes with multiple modes defined such that a base mode has a size corresponding to a smallest vector element size, which is a factor of a size of the first and second input operands, and a higher mode has a size that is a multiple of the base mode size. The vector elements of the first input operand are modified with a bit mask based on a size of the vector elements. The modified vector elements of the first input operand and the vector elements of the second input operand are input into a single hardware tree configured for subdivision into staggered subtrees a size of each of which being based on the base mode size.

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Hyde Park, NY, United States of America

Patrick M West, Jr