Institut National De La Recherche Scientifique

Patrick Kilcullen

Jinyang Liang

Cheng Jiang

A system and a method for high-speed dual-view band-limited illumination profilometry using temporally interlaced acquisition is disclosed. The method comprises using a projecting unit for projecting sinusoidal fringe patterns onto an object and capturing fringe patterns deformed by the object. A 3D image of the object is recovered pixel by pixel from partial images provided by a first camera and a second camera by locating a point in the images of the second camera that matches a selected pixel of the first camera. 3D coordinates and wrapped phase are then estimated based on a calibration of the cameras and determining an horizontal coordinate on the plane of a projector of the projecting unit based on a calibration of the projector, and using a wrapped phase value to recover a 3D point of 3D coordinates (x, y, z).

Method and system for high-speed dual-view band-limited illumination profilometry

A method for 3D surface imaging of an object, comprising generating a sinusoidal pattern from an input beam; projecting the sinusoidal pattern onto the object; acquiring deformed structured images from the object; reconstructing and displaying the surface of the object in real-time. A system comprises an device encoding an input beam with a structured pattern; a filter configured to spatially filter the encoded beam; a projector lens projecting the structured pattern onto the object; a high speed camera acquiring a structured pattern deformed by the 3D surface of the object; a graphic processing unit; and a CoaXPress interface transferring data acquired by the camera to the graphic processing unit; the graphic processing unit reconstructing and displaying the 3D surface of the object in real-time.

Growing community of inventors

Montréal, Canada

Patrick Kilcullen