Lucent Technologies Inc.

Patrick J Doran

Daniel Kern

James F Dormer

Patrick J Drummond

Aristotle B Allen

An automated monitoring and notification system for use with a testing arrangement is able to identify &ldquo;potentially faulty test sockets&rdquo;. The system uses a set of pre-existing data contained in a manufacturing database regarding the number of device failures for each socket. A threshold number of consecutive device failures is used to flag a particular test socket as &ldquo;suspect&rdquo;. Another database, containing historical &ldquo;failure&rdquo; data for the test sockets is then queried upon identification of each &ldquo;suspect&rdquo;. When the number of &ldquo;failures&rdquo; for a &ldquo;suspect&rdquo; exceeds a predetermined threshold, the socket is identified as &ldquo;potentially faulty&rdquo; and an alarm is sent to the system user.

Automated test position monitoring and notification system

A method and system for assigning a classification to a device having a set of qualifying classifications. The method includes the steps of obtaining an inventory count for each classification of device included in the set of qualifying classifications, comparing the inventory count for each such classification to a safety stock number, and assigning a classification to the device from among the classifications which have an inventory count less than the safety stock number. The method enables improved classification assignment with respect to both present demands and future, projected demand thereby more optimally utilizing and distributing inventory. The system may comprise a network of multiple processors which interact with a manufacturing platform

Product classification process for optical subassemblies

Disclosed is a method for fabricating devices so that several devices at a time can be tested and sorted. The devices are placed in a carrier so that each device occupies a discrete position. The carrier includes an identification marker, and each device is identified by its position in the carrier. The carrier is sent to multiple assembly and/or testing stations, and data for each device is collected and stored in a central data base according to its position in the carrier. Each device may then be sorted according to the collected data and its position in the carrier.

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Whitehall, PA, United States of America

Patrick J Doran