Johnstech International Corporation

Tapt Interconnect, LLC

Patrick J Alladio

Brian Warwick

Jeffrey C Sherry

Russell F Oberg

John E Nelson

Gary William Michalko

Gary W Michalko

The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that includes a top contact plate facing the device under test, a bottom contact plate facing the load board, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The top and bottom pins contact each other at an interface that is inclined with respect to the membrane surface normal. When compressed longitudinally, the pins translate toward each other by sliding along the interface. The sliding is largely longitudinal, with a small and desirable lateral component determined by the inclination of the interface.

Electrically conductive pins for microcircuit tester

The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that includes a top contact plate facing the device under test, a bottom contact plate facing the load board including a rocker base protrusion, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The top and bottom pins contact each other at an interface that is inclined with respect to the membrane surface normal. When compressed longitudinally, the pins translate toward each other by sliding along the interface. The sliding is largely longitudinal, with a small and desirable lateral component determined by the inclination of the interface.

Microcircuit tester with slideable electrically conductive pins

A test fixture () is disclosed for electrically testing a device under test () by forming a plurality of temporary mechanical and electrical connections between terminals () on the device under test () and contact pads () on the load board (). The test fixture () has a replaceable membrane () that includes vias (), with each via () being associated with a terminal () on the device under test () and a contact pad () on the load board (). In some cases, each via () has an electrically conducting wall for conducting current between the terminal () and the contact pad (). In some cases, each via () includes a spring () that provides a mechanical resisting force to the terminal () when the device under test () is engaged with the test fixture ().

Test contact system for testing integrated circuits with packages having an array of signal and power contacts

An electronic device test fixture deploys a plurality of contact elements in a dielectric housing. The plumb arrangement of contact elements each include an armature or transversal configured to first depress and then slide laterally when urged downward by the external contacts of a device under test. The rotary movement of the transversal is optimized via the configuration of a surrounding forked regulator such that surface oxide deposition on the external device under test terminal is disrupted to reliably minimize contact resistance without damaging or unduly stressing the electrical junction of the device under test.

Electronic device test fixture

A system for testing a microcircuit having a center ground (CG) terminal has an insert for electrically connecting the CG terminal to a ground contact on a load board. The insert is held within a housing by compression and frictional interaction between a resilient projection carried by the insert and a slot in a wall of an aperture holding the insert.

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Santa Rosa, CA, United States of America

Patrick J Alladio