Custom One Design, Inc.

Patrick G Dannen

Lev E Bromberg

Peter R Nuytkens

Ahmed Mitwalli

Andrew Miller

Robert A Most

An integrated circuit testing apparatus includes a probe card and a probe unit. The probe unit includes a plurality of conductive elastic bumps and a plurality of conductors positioned to conduct signals from the bumps to the probe card. The testing apparatus can further includes a substrate disposed between the probe card and the probe unit, and a flexible member disposed adjacent the substrate.

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Boston, MA, United States of America

Patrick G Dannen