Koninklijke Philips Corporation N.v.

Patrick Fernandes Machado

Christiaan Varekamp

Abraham Karel Riemens

Bart Gerard Bernard Barenbrug

Robert-Paul Mario Berretty

A method of up-scaling a first structure of samples representing a first property, the first structure having a source resolution, into a second structure of samples representing the first property, the second structure having a target resolution, on basis of a third structure of samples representing a second property, the third structure having the source resolution and on basis of a fourth structure of samples representing the second property, the fourth structure of samples having the target resolution, the method comprising: assigning weight factors to respective first samples of the first structure of samples on basis of differences between respective third samples of the third structure of samples and fourth samples of the fourth structure of samples; and computing the second samples of the second structure of samples on basis of the first samples of the first structure of samples and the respective weight factors.

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Barcelos, Portugal

Patrick Fernandes Machado