Intel Corporation

Patrick Elwer

Gregory F Taylor

Tawfik Arabi

Dan Murray

Srirama Pedarla

Srirama Pedaria

Some embodiments of the invention include apparatus and systems having integrated circuits. Terminals or pins of the integrated circuits are configured to be driven to a state, to be floated for a time interval, and to be measured to determine the state of the terminals after the time interval. The measurement involves sampling the RC time constant of leakage current of the terminals. Other embodiments are described and claimed.

AC testing of leakage current in integrated circuits using RC time constant

A method of testing an integrated circuit includes applying a voltage to one of the pins of the integrated circuit. The pin is floated for a predetermined time. A measurement is performed after the predetermined time. The measurement involves sampling the RC time constant of leakage current of the pins.

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Hillsboro, OR, United States of America

Patrick Elwer