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Otrsotech, Limited Liability Company

Pat Hom

Harold Wallace Dozier

Eric T West

Lyle Smith

Rabi Sengupta

Steven Eplett

Steven Craig Eplett

Eric West

Stephen Eplett

Logic blocks for IC designs (including gate-array, standard cell, or logic array designs) provide Design-for-Test-enabled flip-flops (DFT-enabled FFs) that inherently insure compliance with DFT rules associated with scan shifting. Test scan-chains are configured by daisy-chaining instances of the logic block in a transparent (invisible) manner to user-designed application circuits, which can be designed without any user-inserted test structures or other regard for DFT considerations. User asynchronous set and reset inputs and all Stuck-At faults on all user pins on these DFT-enabled FFs are observable via capture and scan-out. A first type of these DFT-enabled FFs features addressable control to partition test the application circuit. A second type of these DFT-enabled FFs features integral capture buffering that eliminates the need for partition test, simplifying control logic and reducing the number of test vectors needed.

Transparent test method and scan flip-flop

An integrated circuit implementation methodology uses mutable cells, e.g. cells that are capable of being personalized for use as one of a plurality of resource types. For example, a mutable cell is designed to have a component layout and a set of lower-layer internal connections compatible with both a design of a flip-flop, and a design of a pair of multiplexers. Independent customizations of the mutable cell, using higher layers of interconnect, efficiently use the cell as a flip-flop or as a pair of multiplexers. Use of mutable cells in an integrated circuit advantageously enables a set of predefined lower-layer photomask, such as for a predefined base array, to be efficiently shared among different applications. In some embodiments, a Simultaneous Dynamical Integration (SDI) Electronic Design Automation (EDA) flow advantageously uses mutable cells, such as to balance demand for resources against supply thereof.

Mutable cells for use in integrated circuits

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Milpitas, CA, United States of America

Pat Hom