Schneider Electric Industries Sas

Mge Ups Systems

Centre National De La Recherche Scientifique

Universite Claude Bernard – Lyon1

Institut National Des Sciences Appliquees De Lyon

Ecole Centrale De Lyon

Supergrid Institute

Pascal Venet

Miao-xin Wang

Radoslava Mitova

Gérard Rojat

Antoine El Hayek

Guy Clerc

Ali Sari

Karim Abdennadher

Christophe Rosset

Laurent Chedot

Thomas Lagier

A method for determining a value representative of the remaining useful life, RUL, of a capacitor, the method comprising the following operations:

Estimation of the remaining useful life of capacitors

A method and device for predicting defects of a capacitor, the method including determining the ripple voltage (Udc), the temperature (TP), and the current (Ic) of the capacitor, determining the value of an equivalent series resistance (ESR) of the capacitor, and the capacitance value (C) of the capacitor using a digital filter, determining information representative of the state of aging of the capacitor according to the temperature of the capacitor, and displaying that information and information representative of the value of the capacitance (C) and/or information representative of a cause associated with the state of aging according to the capacitance value. The device may include a converter and an uninterruptible power supply.

Method and device for predicting electrolytic capacitor defects, converter and uninterruptible power supply equipped with such a device

Growing community of inventors

Saint Jean de Niost, France

Pascal Venet