Carl Zeiss Microscopy Gmbh

Pascal Frank

Bjoern Gamm

The invention relates to a method for generating an image of an object () using a particle beam device () generating a beam of charged particles. Moreover, the invention relates to a particle beam device () for carrying out this method. In particular, the particle beam device () is an electron beam device and/or an ion beam device. The method comprises selecting a desired value of a depth of field from a plurality of values of the depth of field by a user, wherein each value of the plurality of values of the depth of field is associated with a specific resolution of the particle beam device (), the specific resolution being achieved when using the desired value of the depth of field. Moreover, the method comprises adjusting the depth of field to the desired value of the depth of field by controlling at least one of: (i) a condenser lens (), (ii) a relative position of the object () to an objective lens () and (iii) a position of an aperture unit () and/or a size of an aperture unit opening (A,), and imaging the object () with the desired value of the depth of field and with the specific resolution associated with the value of the depth of field.

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Essingen, Germany

Pascal Frank