Texas Instruments Corporation

Pascal Cussonneau

Gregory R Conti

Vincent Chalendard

Benoit Drevet

Eric Bernillon

A method and apparatus for testing of integrated circuits using a Direct Memory Load Execute Dump (DMLED) test module. The method includes loading a test case into a memory using the DMLED test module, loading initialization signatures of fixed pattern into the memory using the DMLED test module, and executing the test case at an operating clock rate of a processor. The method further includes writing result signatures into the memory, and dumping the results signatures from the memory to a tester using the DMLED test module.

Testing of integrated circuits using test module

A system comprising processing logic adapted to determine a type of boot performed by the system and a storage coupled to the processing logic. The processing logic is configured to erase or invalidate a predetermined portion of the storage, and to activate or deactivate an interface by which the system is accessed, if the type of boot comprises a functional boot.

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Antibes, France

Pascal Cussonneau