Freescale Semiconductor,inc.

Nxp USA, Inc.

Pascal Caunegre

Mehul D Shroff

Xavier Hours

Christophe Oger

An integrated circuit design tool apparatus includes a processing resource configured to support a circuit simulator, a circuit sensitivity optimizer and a circuit sensitivity calculator. The circuit sensitivity optimizer is adapted to communicate to the circuit simulator a first dynamic list of selected devices of the circuit; and a second dynamic list of selected process parameters associated with the selected devices of the first dynamic list. The circuit simulator is configured to communicate to the circuit sensitivity calculator, a performance metrics of the circuit in response thereto. The circuit sensitivity calculator is configured to determine one sensitivity coefficient for each device of the first dynamic list in response thereto. The circuit sensitivity calculator is further configured to determine and communicate to the circuit sensitivity optimizer a variance of the performance metrics and also adapted to gradually determine whether or not to further communicate with the circuit simulator.

Tool apparatus, method and computer program for designing an integrated circuit

A simulation system for testing a simulation of a device against one or more violation rules is described. The simulation system comprises a device simulator for executing the simulation of a device using a device design, a device model and a simulation scenario; and one or more violation monitors, one for each violation rule. Each violation monitor comprises a violation information detector for detecting one or more violations of the respective violation rule during the executing of the simulation and, for each violation, determining information representing the respective violation; a violation score unit for calculating, for each violation of the respective violation rule, a violation score in dependence on the information representing the violation and on a violation rule-specific scheme, and a rule score unit for determining, for the respective violation rule, a rule score from the violation scores of the one or more violations during the simulation. The simulation system further comprises a reporting unit for preparing a report of the rule scores associated with the one or more violation rules and for reporting the report to a user. A method of testing a simulation of a device against one or more violation rules is described.

Simulation system and method for testing a simulation of a device against one or more violation rules

An integrated circuit design tool apparatus including a processing resource arranged to support a circuit simulator, a circuit simulator interrogator, and a well distance calculator is provided. The circuit simulator interrogator communicates first and second well distance values separately to the circuit simulator and receives first and second performance parameter value back from the circuit simulator interrogator in response. The well distance calculator determines a performance parameter limit value, and projects, substantially linearly, a well distance change value in respect of the performance parameter limit value using the first and second performance parameter values, the performance parameter limit value and a trial well distance change value. Also, a well distance change characterizing equation using the well distance change value projected is used in order to obtain the minimum well distance value associated with the performance parameter limit value.

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Cugnaux, France

Pascal Caunegre