Nxp B.v.

Sciosense B.v.

Ams International Ag

Ams Ag

Pascal Bancken

Viet Nguyen Hoang

Radu Surdeanu

David Van Steenwinckel

Benoit Bataillou

Roel Daamen

Viet Nguyen

Dimitri Soccol

Gian Hoogzaad

Peter Hubertus Franciscus Deurenberg

Aurelie Humbert

Axel Nackaerts

Nebojsa Nenadovic

Gert-Jan Koolen

Robertus A M Wolters

Viet Hoang Nguyen

Julien M M Michelon

Martinus P M Maas

In an embodiment a method includes determining, for each capacitor element of a plurality of capacitor elements of a capacitor, an increase of a capacitance of a capacitor element caused by a decrease of a temperature of the capacitor and deriving a dew point from a temperature at which the increases of the capacitances or values corresponding to the increases of the capacitances exceed a predefined limit by generating a set of binary digits, each of the binary digits corresponding to one of the capacitor elements and indicating whether the capacitance of the capacitor element is within a predefined range, comparing sets of binary digits generated at different temperatures and determining a number of capacitor elements for which the corresponding binary digits of the sets are different and repeating the comparison for a sequence of sets generated at decreasing temperatures.

CMOS compatible dew point sensor device and method of determining a dew point

In an embodiment a dew point sensor device includes a semiconductor substrate, a top layer arranged on the semiconductor substrate, a Peltier element integrated in the semiconductor substrate, a temperature sensor, a capacitor arranged at a surface of the top layer facing away from the semiconductor substrate, the temperature sensor and the capacitor being arranged so that a temperature of the capacitor is measurable by the temperature sensor, wherein the capacitor includes a plurality of capacitor elements each having a capacitance, and an electronic circuit configured for an individual determination of the capacitances and a generation of a set of binary digits, each of the binary digits corresponding to one of the capacitor elements and indicating whether the capacitance of the capacitor element is within a predefined range.

CMOS-compatible dew point sensor device and method of determining a dew point

One example discloses a breach sensor, comprising: a substrate including an integrated circuit; a passivation layer coupled to the substrate; a breach sensing element coupled to the circuit; wherein the breach sensing element is on a first side of the passivation layer and the substrate is on a second side of the passivation layer; a barrier configured to separate the breach sensing element from an ambient environment; wherein the breach sensing element is responsive to barrier damage.

Breach sensor

A light sensor device comprises a substrate () having a well () defined in one surface. At least one light sensor () is formed at the base of the well (), and an optical light guide () in the form of a transparent tunnel () within an opaque body () extends from a top surface of the device down a sloped side wall of the well () to the location of the light sensor ().

Light sensor device and manufacturing method

An integrated circuit and a method of making the same. The integrated circuit includes a semiconductor substrate. The integrated circuit also includes a relative humidity sensor on the substrate. The relative humidity sensor includes a first sensor electrode, a second sensor electrode, and a humidity sensitive layer covering the first and second electrodes. The integrated circuit further includes a thermal conductivity based gas sensor on the substrate. The thermal conductivity based gas sensor has an electrically resistive sensor element located above the humidity sensitive layer.

Integrated circuit comprising a thermal conductivity based gas sensor

A method of characterizing an LED, as well as an integrated circuit using this method, based on a so-called characteristic resistance, in which the LED is operated at a first, relatively low, operating current and then at a second, relatively high, operating current. From the ratio between the difference between the forward voltages at these two operating currents, and the difference between the operating current, the characteristic resistance is determined. The characteristic resistance is measured at two or more moments during the operational lifetime of the device, and a prediction or estimate is made in relation to the total operational lifetime of the devices, from the evolution or change of the characteristic resistance.

Method of characterising an LED device

A display device comprises a substrate which carries an array of pixels. Each pixel comprises an array of apertures in the substrate, each aperture of the array having a maximum opening dimension less than the wavelength of the light to be transmitted through the aperture. The effective dielectric constant of the aperture and/or the dielectric constant of the substrate is varied, thereby to vary the light transmission characteristics of the pixel between transmission of at least one frequency in the visible spectrum and transmission of substantially no frequency in the visible spectrum.

Display device

A method of determining the dominant output wavelength of an LED, includes determining an electrical characteristic of the LED which is dependent on the voltage-capacitance characteristics, and analyzing the characteristic to determine the dominant output wavelength.

Lighting unit with compensation for output frequency, and method for determining output frequency

A sensor for sensing an analyte includes capacitive elements, each having a pair of electrodes separated by a dielectric wherein the dielectric constant of the dielectric of at least one of the capacitive elements is sensitive to the analyte, the sensor further including a comparator adapted to compare a selected set of capacitive elements against a reference signal and to generate a comparison result signal, and a controller for iteratively selecting the set in response to the comparison result signal, wherein the sensor is arranged to produce a digitized output signal indicative of the sensed level of the analyte of interest. An IC comprising such a sensor, an electronic device comprising such an IC and a method of determining a level of an analyte of interest using such a sensor are also disclosed.

Capacitive sensor, integrated circuit, electronic device and method

A lighting system for exterior lights of an automobile comprises a first lighting unit () primarily for outputting a first automotive light signal and a failure detection system () for detecting a failure of the first lighting unit (). A second lighting unit is primarily for outputting a second automotive light signal. The second lighting unit comprises an LED light unit. A controller () is adapted to determine if there is failure of the first lighting unit, and if there is failure of the first lighting unit, to use the second lighting unit to generate the first automotive light signal. This is in response to an output request from the first lighting unit ().

Exterior vehicle lights

A method is disclosed of controlling a LED, comprising driving the LED with a DC current for a first time, interrupting the DC current for a second time such that the first time and the second time sum to a period, determining at least one characteristic of the LED while the DC current is interrupted, and controlling the DC current during a subsequent period in dependence on the at least one characteristic. The invention thus benefits from the simplicity of DC operation. By operating at the LED in a DC mode, rather than say in a PWM mode, the requirement to be able to adjust the duty cycle is avoided. By including interruptions to the DC current, it is possible to utilize the LED itself to act as a sensor in order to determine a characteristic of the LED. The need for additional sensors is thereby avoided.

Method of controlling an LED, and an LED controller

A method of estimating the junction temperature of a light emitting diode comprises driving a forward bias current through the diode, the current comprising a square wave which toggles between high and low current values (I, l), the high current value (l) comprising an LED operation current, and the low current value (I) comprising a non-zero measurement current. The forward bias voltage drop (Vf) is sampled and the forward bias voltage drop (Vf) is determined at the measurement current (I)&#x2014;The temperature is derived from the determined forward bias voltage drop.

System and method for estimating the junction temperature of a light emitting diode

A method of estimating the output light flux of a light emitting diode, comprises applying a drive current waveform to the LED over a period of time comprising a testing period. The forward voltage across the LED is monitored during the testing period, and the output light flux is estimated as a function of changes in the forward voltage.

System and method for output flux measurement of light emitting diode

An apparatus comprising at least one measuring cell () is disclosed. The measuring cell comprises a first cavity (and a second cavity () perpendicular to the first cavity, the first cavity and the second cavity comprising an overlap at first respective ends and a reflective surface () at the opposite respective ends. A beam splitter () is located in the overlap and an electromagnetic radiation source () is arranged to project a beam of electromagnetic radiation onto the beam splitter () such that the beam is projected into each of the cavities. A phase detector () for detecting a phase difference between the respective electromagnetic radiation reflected by the first and second cavity () is also provided. In addition, the apparatus has a fluid channel (), at least a part of which runs parallel to the first cavity () such that the electromagnetic radiation projected into the first cavity extends into said part of the fluid channel. This allows for the interferometric detection of particles in the fluid channel.

Measuring apparatus

The present invention relates to a calibration circuit, computer program product, and method of calibrating a junction temperature measurement of a semiconductor element, wherein respective forward voltages at junctions of the semiconductor element and a reference temperature sensor are measured, and an absolute ambient temperature is determined by using the reference temperature sensor, and the junction temperature of the semiconductor element is predicted based on the absolute ambient temperature and the measured forward voltages.

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Opwijk, Belgium

Pascal Bancken