Ultratech, Inc.

Aoptix Technologies, Inc.

Eos Defense Systems USA, Inc.

Collinear Networks, Inc.

Paolo Zambon

Siegfried Fleischer

Malcolm J Northcott

J Elon Graves

James McWhirter

David Gaines

Joseph Lee

Yu Chun Chang

Jeffrey Tuttle

An optical communication system includes a free space optical transceiver within a housing to transmit and receive optical communication signals along an optical pathway through a window in the housing. Heating elements applied to the interior surface of the window substantially uniformly heat the window such that the window is kept free from condensation and ice without introducing significant distortions in the wavefront. Accordingly, the heating elements are designed and placed on the window such that the obscuration caused by the presence of the heating elements within the optical pathway and the wavefront distortion caused by temperature gradients within the cross-section of the window in the optical pathway cause less than 1 decibel (dB) in transmission loss as compared to the same system without the heating elements on the window.

Window heater with reduced wavefront distortion

A low cost, high reliability system for correcting aberrations in optical signals is disclosed. A foreoptic assembly, such as a telescope, receives an incoming optical signal and directs it to an active optical element, such as a fast steering mirror. The incoming optical signal is diffracted by a diffractive optical element to shape the image that is formed at a wavefront sensor, such as a quad-cell. The wavefront sensor measures a tip-tilt aberration of the incoming optical signal and the active optical element is adjusted to correct the measured aberration. An outgoing optical signal can be transmitted along substantially the same optical path as the incoming optical signal, but in the opposite direction. Thus, the aberration measured from the incoming optical signal can be automatically accounted for in the outgoing optical signal.

Simple low cost tip-tilt wavefront sensor having extended dynamic range

Systems and methods for performing semiconductor laser annealing using dual loop control are disclosed. The first control loop operates at a first frequency and controls the output of the laser and controls the 1/f laser noise. The second control loop also controls the amount of output power in the laser and operates at second frequency lower than the first frequency. The second control loop measures the thermal emission of the wafer over an area the size of one or more die so that within-die emissivity variations are average out when determining the measured annealing temperature. The measured annealing temperature and an annealing temperature set point are used to generate the control signal for the second control loop.

Dual-loop control for laser annealing of semiconductor wafers

Growing community of inventors

Campbell, CA, United States of America

Paolo Zambon