Stmicroelectronics S.r.l.

Sgs-thomson Microelectronics S.r.l.

Micron Technology Incorporated

Other

Micro Technology, Inc.

Paolo Rolandi

Luigi Pascucci

Massimo Montanaro

Marco Giovanni Fontana

Antonio Barcella

Giorgio Oddone

Cristiano Calligaro

Guido Torelli

Tommaso Zerilli

Raffaele Bufano

Sandra Lospalluti

Stefano Andreoli

Roberto Gastaldi

Mauro Pagliato

Marco Dallabora

Alessandro Manstretta

Marco Riva

Marco Maccalli

Vincenzo Daniele

A non-volatile electronic memory device is integrated on a semiconductor and is of the Flash EEPROM type with a NAND architecture including at least one memory matrix divided into physical sectors, intended as smallest erasable units, and organized in rows or word lines and columns or bit lines of memory cells. At least one row or word line of a given physical sector is electrically connected to at least one row or word line of an adjacent physical sector to form a single logic sector being erasable, with the source terminals of the corresponding cells of the pair of connected rows referring to a same selection line of a source line.

Memory device with a common source select line for two memory portions of a logic sector

Programming non-volatile electronic memory device with NAND architecture

Electronic memory device having two portions that can be decoupled

Semiconductor device formed by a first conductive strip of semiconductor material; a control gate region of semiconductor material, facing a channel portion of the first conductive strip, and an insulation region arranged between the first conductive strip and the control gate region. The first conductive strip includes a conduction line having a first conductivity type and a control line having a second conductivity type, arranged adjacent and in electrical contact with each other, and the conduction line forms the channel portion, a first conduction portion and a second conduction portion arranged on opposite sides of the channel portion.

Semiconductor field-effect transistor, memory cell and memory device

Example embodiments for configuring a serial non-volatile memory device may comprise a non-volatile configuration register to store a configuration value received from the processor, the configuration value to specify one or more attributes of a memory access operation. The configuration value may be read at least in part in response to power being applied to the memory device.

Non-volatile configuration for serial non-volatile memory

Example embodiments for configuring a serial non-volatile memory device for an execute-in-place mode may comprise a non-volatile configuration register to store an execute-in-place mode value that may be read at least in part in response to power being applied to the memory device.

Execute-in-place mode configuration for serial non-volatile memory

Non-volatile electronic memory device with NAND structure being monolithically integrated on semiconductor

An integrated circuit for storing data, and for application in a memory card that operates in cooperation with at least one of an external acquisition system and an external processing system includes input/output terminals for receiving the data to be stored, and an electrically programmable non-volatile memory for storing the data in digital format. The memory includes a first terminal for receiving a programming signal for enabling storage of the data, and a second terminal for receiving a reading signal for enabling output of the stored data via the input/output terminals. A memory control circuit is connected to the first and second terminals of the electrically programmable non-volatile memory, and to the input/output terminals for generating programming and reading signals based upon the command signal. The electrically programmable non-volatile memory is erasable by electromagnetic radiation for permitting a non-electrical erasure of the stored data.

Integrated circuit for memory card and memory card using the circuit

A method for accessing, in reading, programming, and erasing a semiconductor-integrated non-volatile memory device of the Flash EEPROM type with a NAND architecture having at least one memory matrix organized in rows or word lines and columns or bit lines, and wherein, for the memory, a plurality of additional address pins are provided. The method provides both an access protocol of the asynchronous type and a protocol of the extended type allowing to address, directly and in parallel, a memory extended portion by loading an address register associated with the additional pins in two successive clock pulses. A third multi-sequential access mode and a parallel additional bus referring to the additional address pins are also provided to allow a double addressing mode, sequential and in parallel.

Method for accessing in reading, writing and programming to a NAND non-volatile memory electronic device monolithically integrated on semiconductor

The invention relates to a row decoder circuit for non volatile memory devices of the electrically programmable and erasable type, for example of the Flash EEPROM type having a NOR architecture. The proposed row decoder circuit allows to carry out the erasing step very quickly, for example with a granularity emulating at least 16 kB and even overcoming by at least 2 kB Flash memories of the NAND type. The memory can thus maintain high performances in terms of random access speed but shows a high erasing speed typical of memory architectures of the NAND type.

Row selector circuit for electrically programmable and erasable non volatile memories

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Voghera, Italy

Paolo Rolandi