Growing community of inventors

Foster City, CA, United States of America

Paola deCecco

Average Co-Inventor Count = 5.00

ph-index = 3

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 28

Paola deCeccoJohn Fielden (139 patents)Paola deCeccoAdy Levy (85 patents)Paola deCeccoChristopher F Bevis (54 patents)Paola deCeccoNoah Bareket (50 patents)Paola deCeccoDan Wack (37 patents)Paola deCeccoMichael Friedmann (34 patents)Paola deCeccoAnatoly Fabrikant (30 patents)Paola deCeccoKenneth P Gross (29 patents)Paola deCeccoDavid Allen Reed (5 patents)Paola deCeccoBruno W Schueler (5 patents)Paola deCeccoMichael C Kwan (5 patents)Paola deCeccoDavid S Ballance (4 patents)Paola deCeccoBoris Golovanevsky (14 patents)Paola deCeccoKen Gross (2 patents)Paola deCeccoDave Ballance (1 patent)Paola deCeccoNoam Knoll (1 patent)Paola deCeccoIan Smith (0 patent)Paola deCeccoBaruch Moshe (0 patent)Paola deCeccoPaola deCecco (5 patents)John FieldenJohn Fielden (139 patents)Ady LevyAdy Levy (85 patents)Christopher F BevisChristopher F Bevis (54 patents)Noah BareketNoah Bareket (50 patents)Dan WackDan Wack (37 patents)Michael FriedmannMichael Friedmann (34 patents)Anatoly FabrikantAnatoly Fabrikant (30 patents)Kenneth P GrossKenneth P Gross (29 patents)David Allen ReedDavid Allen Reed (27 patents)Bruno W SchuelerBruno W Schueler (26 patents)Michael C KwanMichael C Kwan (19 patents)David S BallanceDavid S Ballance (15 patents)Boris GolovanevskyBoris Golovanevsky (14 patents)Ken GrossKen Gross (2 patents)Dave BallanceDave Ballance (1 patent)Noam KnollNoam Knoll (1 patent)Ian SmithIan Smith (0 patent)Baruch MosheBaruch Moshe (0 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Revera, Incorporated (5 from 21 patents)

2. Kla-tencor Technologies Corporation (641 patents)


5 patents:

1. 9201030 - Method and system for non-destructive distribution profiling of an element in a film

2. 8610059 - Method and system for non-destructive distribution profiling of an element in a film

3. 8269167 - Method and system for non-destructive distribution profiling of an element in a film

4. 7884321 - Method and system for non-destructive distribution profiling of an element in a film

5. 7411188 - Method and system for non-destructive distribution profiling of an element in a film

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1/5/2026
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