Other

Pamela K Schuster

Marvin C Conrad

James W Strong

A method and apparatus to enable real time recording and analysis of defects in manufactured products and expedite real time identification and correction of errors in production and assembly operations is provided. It is intended for use where a multitude of different parts are used to make multiple units of a device typically formed by stuffing components into a printed circuit board, therebeing one or more printed circuit boards in the finished assembly typically having a chassis and wiring harness. Support for fully integrated multiple inspection stations is disclosed. The inspection stations include terminals utilizing light pens and screens to input codes classifying defects, and also includes facilities and functions to capture defect data from automatic testing equipment. Real time output of defect indications and trends including classification thereof is provided both at the station, and through reporting stations distant from the manufacturing floor.

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Houston, TX, United States of America

Pamela K Schuster