Texas Instruments Corporation

Padmini Sampath

Saya Goud Langadi

Rubin Ajit Parekhji

Prohor Chowdhury

Swathi Gangasani

Srinivasulu Alampally

Srinivasa B S Chakravarthy

Chirag Sureshchandra Gupta

A memory system includes a memory and a memory controller coupled to the memory. The memory controller includes a data buffer configured to store a full data word as a result of a partial write operation, wherein for a subsequent partial write operation, data is read from the data buffer.

Partial-writes to ECC (error check code) enabled memories

A built-in self-test (BIST) diagnostic system tests the execution of a processor. The processor is arranged to execute a normal application for controlling a process that is external to the processor. The normal execution is executed in normal execution timeslots that have idle timeslots that are interspersed in time between the normal execution timeslots. A BIST controller is arranged to detect the presence of an idle timeslot in the execution of the processor and to use a scan chain to scan-in a first test pattern for a test application for testing the processor. The first test pattern is executed by the processor during the detected idle timeslot and a first result pattern generated by the execution of the first test pattern is scanned-out. The scanned-out first test pattern is evaluated to determine the presence of an error. The first test pattern application is conditionally interruptible.

Interruptible non-destructive run-time built-in self-test for field testing

Circuit for detecting malfunction of a primary clock in SoCs comprises a primary clock circuit having a GRAY code counter for generating a GRAY code sequence based on a number of clock pulses generated Primary clock. A secondary clock circuit is configured to output a secondary clock pulse on each saturation of a secondary clock counter. A clock gated register circuit is clocked by the secondary clock pulse, and is configured to store a plurality of values of the GRAY code sequence, and update the plurality of values of the GRAY code sequence on each saturation of the secondary clock counter. An error detection circuit is configured to output a detection signal for detecting the malfunction of primary clock based on a comparison of the updated plurality of values of the GRAY code sequence with at least one predetermined threshold associated with the malfunction of primary clock.

Circuits and methods for clock malfunction detection

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Padmini Sampath