Teradyne, Inc.

Padmanabha S Kannampalli

Jae D Roh

Eric W Bull

Katherine R Jong

Andrew J Staniszewski

Prabhakar Hegde

An example system includes a first memory that includes primary storage; a second memory that includes secondary storage; and a control system for predicting paths through a test program that will be taken during a planned execution of the test program, and for causing test data associated with the test program to be stored in the first memory or the second memory based on the paths predicted.

Controlling storage of test data based on prior test program execution

Example techniques may be implemented as a method, a system or more non-transitory machine-readable media storing instructions that are executable by one or more processing devices, Operations performed by the example techniques include obtaining data representing results of tests executed by one or more test instruments on an initial set of devices under test (DUTs) in a test system; and using the data to train a machine learning model. The machine learning model is for predicting which of the tests will produce failing results for a different set of DUTs. DUTs in the different set have one or more features in common with DUTs in the initial set.

Growing community of inventors

Oak Park, CA, United States of America

Padmanabha S Kannampalli