Georgia Tech Research Corporation

Pablo Gabolde

Rick P Trebino

Pamela Bowlan

Various systems and methods for analysis of optical pulses are provided. In one embodiment, an optical system is provided having an optical axis. The optical system includes a two-dimensional diffraction grating positioned along the optical axis, and a spectral filter positioned along the optical axis after the two-dimensional diffraction grating. The spectral filter is angularly offset about a vertical transverse angle associated with the optical system. The diffraction grating is angularly offset about the optical axis relative to the spectral filter, and an optical capture device positioned after the spectral filter.

Determining electric field characteristics of laser pulses

Disclosed are an apparatus and methods for determining electric field characteristics of pulses. In one example, a method is provided in which an unknown pulse is propagated through a first optical fiber. A reference pulse is propagated through a second optical fiber. The unknown pulse and the reference pulse are directed out of the first and second optical fibers into a spectrometer. The unknown pulse and the reference pulse propagate along a pair of crossing trajectories through the spectrometer to form an interferogram. The electric field of the unknown pulse is determined by processing this interferogram.

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Pablo Gabolde