Northrop Grumman Systems Corporation

Applied Research Associates, Inc.

Owen Cupp

Scott R Sorbel

Thomas E Keavney

George Antilla

Peter J Widmann

Tri Van

Systems and methods are provided for modeling electromagnetic properties of an assembly. The system includes a modeling component configured to divide the assembly into a plurality of subdomains, with each subdomain representing a three-dimensional volume of the assembly, and determine a set of standard elemental basis functions for each subdomain, such that a linear combination of elemental basis functions represents the electromagnetic properties of a portion of the geometry of the subdomain. A synthetic function generator is configured to generate a set of synthetic 'entire-domain' basis functions for each subdomain from its set of elemental basis functions. A response characterization component is configured to determine the electromagnetic properties of the assembly from the sets of synthetic basis functions for each subdomain and an excitation matrix representing simulated incident electrical and magnetic stimulation to the assembly.

Efficient modeling of electromagnetic properties of an assembly

Systems and methods are provided for redirecting electromagnetic radiation around an object. A first assembly, including a first interior wall and a first exterior wall enclosing a propellant gas, substantially encloses the object. A first control system is configured to energize the propellant gas to provide a first volume of plasma and control an electron number density of the first volume of plasma. The electron number density of the first volume of plasma is selected to minimize reflection of the electromagnetic radiation from the first exterior wall. A second assembly includes a second interior wall and a second exterior wall enclosing a propellant gas and is substantially concentric with the first assembly and substantially encloses the object. A second control system is configured to energize the propellant gas to provide a second volume of plasma and control an electron number density of the second volume of plasma.

Electromagnetic wave refraction via controlled plasma

Growing community of inventors

Fullerton, CA, United States of America

Owen Cupp