Diamontech Ag

Diamontech Gmbh

Otto Hertzberg

Alexander Bauer

Thorsten Lubinski

Hermann Von Lilienfeld-Toal

Miguel Angel Pleitez Rafael

Tabea Pfuhl

Werner Mäntele

Tobias Lieblein

Arne Küderle

Werner Mantele

Arne Kuderle

Arne Kürderle

An apparatus for analyzing a material includes an excitation emission device for generating at least one electromagnetic excitation beam, in particular an exciting light beam, having at least one excitation wavelength, further comprising a detection device for detecting a reaction signal, and a device for analyzing the material on the basis of the detected reaction signal.

Device and method for analyzing a material

A method and apparatus for analyzing a substance is disclosed. An optical medium is arranged on a substance surface with at least one region of the optical medium surface in contact with the substance surface. An excitation light beam is emitted through the contacting region of the medium surface (to the substance surface. A measurement light beam is emitted through the optical medium to the contacting region of the medium surface such that the measurement light beam and the excitation light beam overlap on the interface of the optical medium and of the substance surface, on which the measurement light beam is reflected. A deflection of the reflected measurement light beam is detected in dependence on the wavelength of the excitation light beam. The substance is then analyzed based on the detected deflection of the measurement light beam in dependence on the wavelength of the excitation light beam.

Non-invasive substance analysis

The invention relates, inter alia, to a device () for analysing a material (), comprising an excitation emission device () for generating at least one electromagnetic excitation beam (SA), particularly an excitation light beam, with at least one excitation wavelength, and further comprising a detection device () for detecting a reaction signal (SR), and a device () for analysing the material on the basis of the detected reaction signal (SR).

The invention relates to analyzing a substance. An optical medium is arrange on a substance surface with at least one region of the optical medium surface in contact with the substance surface. An excitation light beam is emitted through the contacting region of the medium surface to the substance surface. A measurement light beam is emitted through the optical medium to the contacting region of the medium surface such that the measurement light beam and the excitation light beam overlap on the interface of the optical medium and of the substance surface, on which the measurement light beam is reflected. A deflection of the reflected measurement light beam is detected in dependence on the wavelength of the excitation light beam. The substance is then analyzed based on the detected deflection of the measurement light beam in dependence on the wavelength of the excitation light beam.

The invention relates, inter alia, to an apparatus () for analyzing a material (), comprising an excitation emission device () for generating at least one electromagnetic excitation beam (SA), in particular an exciting light beam, having at least one excitation wavelength, further comprising a detection device () for detecting a reaction signal (SR), and a device () for analyzing the material on the basis of the detected reaction signal (SR).

Apparatus and method for analyzing a material

The invention relates to an apparatus for analyzing a material comprising an excitation emission device for generating at least one electromagnetic excitation beam, in particular an exciting light beam, having at least one excitation wavelength, further comprising a detection device for detecting a reaction signal, and a device for analyzing the material on the basis of the detected reaction signal.

Growing community of inventors

Frankfurt am Main, Germany

Otto Hertzberg