Witec Wissenschaftliche Instrumente Und Technologie Gmbh

Universitat Ulm

Carl Zeiss Jena Gmbh

Landesstiftung Baden-Württemberg Gmbh

Witec Wissenchaftliche Instrumente Und Technologie Gmbh

Othmar Marti

Peter Spizig

Joachim Koenen

Jörg Förstner

Gerhard Volswinkler

Detlef Sanchen

Thomas Stifter

Tobias Neckernuss

Daniel Geiger

Thomas Schimmel

Robert Brunner

Hans-Ulrich Krotil

Detief Sanchen

An apparatus for detecting a spatial elongation of at least one adherent biological cell is provided. The apparatus contains at least one biological cell, which is adhered to a substrate, a laser for irradiating the at least one biological cell for a spatial elongation of the cell in a direction parallel to the irradiation direction and a detector for detecting the spatial elongation of the cell in the direction parallel to the radiation direction. Further, a corresponding method for spatial elongation of an adherent biological cell is provided and the uses of the apparatus and of the method proposed. Using the apparatus and method, it is possible to ascertain, from parts of adherent cells to entire groups of adherent cells, the mechanical properties in the natural, adherent state of the cell(s) in spatially selective, temporally selective and contactless fashion.

Apparatus and method for detecting a spatial elongation of at least one adherent biological cell

Disclosed is a method for analysing cells, in which cells are separated and the individual cells pass via a measurement region of a unit for spatially resolved radiation intensity measurement, wherein, for at least one of the separated cells, when passing via the measurement region, a time sequence of spatial intensity patterns of an electromagnetic radiation emitted from and/or influenced by the cell is created, the optical flow of a respective two of the spatial intensity patterns is calculated for at least one portion of the sequence of intensity patterns using a computer unit, and an evaluation of the calculated optical flows occurs. Also disclosed is a device for analysing cells, comprising a device for separating cells, a unit for spatially resolved radiation intensity measurement, and a computer unit for calculating the optical flow of a respective two of the created intensity patterns, and for evaluating the calculated optical flows.

Method and device for analysing cells

A microscope, in particular a scanning probe microscope, comprising a programmable logic device.

Scanning probe in pulsed-force mode, digital and in real time

The present invention concerns a method for a location and/or time-dependent alteration of the friction coefficient and/or adhesion force between two bodies, which includes irradiation of one or both contact surfaces between the bodies with radiation, use of the method according to the invention for location and/or time-dependent alteration of the friction coefficient and/or adhesion force between to bodies, a system that includes two bodies in which the friction coefficient and/or the adhesion force between the bodies can be temporarily or permanently altered, and a device for location and/or time-dependent regulation of the friction coefficient and/or adhesion force which includes the system according to the invention and a control unit.

Lubrication by exposure to light

Microscope, in particular a scanning probe microscope, comprising a programmable logic device.

The invention relates to a method for creating the image of a sample surface to be analyzed, with a resolution which is better than 1 &#x3bc;m laterally in relation to the sample surface and better than 100 nm vertically in relation to said surface. According to the invention, the surface is scanned on a point-by-point basis by a scanning probe, the distance between the scanning probe and the sample surface at each scanning point being periodically modulated, in such a way that a force-time curve of the probe is produced for this point. The force-time curve is recorded at each scanning point, digitized using an A/D converter, evaluated online in real-time and stored, together with the entire data stream, in a first area of a memory device. One or several characteristic variables of the force-time curves are determined for each scanning point from the real-time evaluation results and the stored digitized force-time curves and an image of the sample surface is obtained from said characteristic variables of the scanning points.

Scanning probe with digitized pulsed-force mode operation and real-time evaluation

A process for the location-resolved simultaneous detection of the adhesion and friction as well as possibly of other material properties of a sample surface to be examined by means of a raster probe microscope comprising a raster probe. The raster probe and/or the sample with sample surface are moved until at a point of the sample surface to be examined the raster probe interacts in a determined manner with this surface. The raster probe and/or the sample are subjected to a vertical oscillation, and a first measuring signal characterized by the deformation of the raster probe is recorded. A second measuring signal characterizing the deformation of the raster probe is recorded, wherein the raster probe and/or the sample are subjected to a horizontal and/or vertical oscillation. From these two measuring signals the desired material properties are determined. For the detection of the entire surface area to be examined the raster probe and or the sample are again moved and for the repetition of the measuring process described brought into contact with the sample surface in the above described manner.

Method and device for simultaneously determining the adhesion, friction, and other material properties of a sample surface

A method for determining the distance of a scanning probe of a scanning probe microscope from a specimen surface to be examined comprising the steps of: exciting the scanning probe to oscillations lateral to a surface to be examined; recording at least one amplitude signal and a frequency signal and a phase signal of the oscillating scanning probe; superimposing a vertically oscillating movement of the scanning probe and specimen surface to be examined relative to one another is superimposed on the oscillation of the scanning probe lateral to the specimen surface to be examined; and determining the distance of the scanning probe from the specimen surface from at least one of the amplitude signal and a frequency signal and a phase signal.

Growing community of inventors

Ulm, Germany

Othmar Marti