Semiconductor Components Industries, LLC

Intel Corporation

Oswald L Skeete

Larry Duane Kinsman

Weng-Jin Wu

Yusheng Lin

Yu-Te Hsieh

Chi-Yao Kuo

Brian A Vaartstra

Derek J Gochnour

John Stephen Guzek

Irfan Rahim

Sabina J Houle

Ravi V Mahajan

Christopher L Rumer

Ross F Jatou

Jeff Wienrich

Mike T Reiter

An image sensor semiconductor package (package) includes a printed circuit board (PCB) having a first surface and a second surface opposite the first surface. A complementary metal-oxide semiconductor (CMOS) image sensor (CIS) die has a first surface with a photosensitive region and a second surface opposite the first surface of the CIS die. The second surface of the CIS die is coupled with the first surface of the PCB. A transparent cover is coupled over the photosensitive region of the CIS die. An image signal processor (ISP) is embedded within the PCB. One or more electrical couplers electrically couple the CIS die with the PCB. A plurality of electrical contacts on the second surface of the PCB are electrically coupled with the CIS die and with the ISP. The ISP is located between the plurality of electrical contacts of the second surface of the PCB and the CIS die.

Image sensor semiconductor packages and related methods

Implementations of image sensor packages may include a plurality of microlenses coupled over a color filter array (CFA), a low refractive index layer directly coupled to and over the plurality of microlenses, an adhesive directly coupled to and over the low refractive index layer, and an optically transmissive cover directly coupled to and over the adhesive. Implementations may include no gap present between the optically transmissive cover and the plurality of microlenses.

Image sensor packages and related methods

Implementations of sensing devices may include a plurality of electromagnetic radiation sensing sections coupled to a flexible interconnect and one or more digital sections coupled to the flexible interconnect. The plurality of electromagnetic radiation sensing sections may be self-aligned through the flexible interconnect.

Flexible interconnect sensing devices and related methods

Implementations of image sensors may include a die having either a rounded corner or a chamfered corner edge, and an optically transmissive cover coupled to the die. The optically transmissive cover may include either a rounded corner or a chamfered corner edge that corresponds with either the rounded corner or the chamfered corner edge of the die.

Semiconductor package with chamfered corners and related methods

In some embodiments, integrated circuit packages including high density bump-less build up layers and a lesser density core or coreless substrate are presented. In this regard, an apparatus is introduced having a first element including a microelectronic die having an active surface and at least one side, an encapsulation material adjacent said at least one microelectronic die side, wherein said encapsulation material includes at least one surface substantially planar to said microelectronic die active surface, a first dielectric material layer disposed on at least a portion of said microelectronic die active surface and said encapsulation material surface, a plurality of build-up layers disposed on said first dielectric material layer, and a plurality of conductive traces disposed on said first dielectric material layer and said build-up layers and in electrical contact with said microelectronic die active surface; and a second element coupled to the first element, the second element including a substrate having a plurality of dielectric material layers and conductive traces to conductively couple conductive contacts on a top surface with conductive contacts on a bottom surface, said conductive contacts on said top surface conductively coupled with said conductive traces of said first element. Other embodiments are also disclosed and claimed.

Integrated circuit packages including high density bump-less build up layers and a lesser density core or coreless substrate

An imaging system may include an integrated circuit package that includes an image sensor die mounted in a flip chip configuration to a package substrate. The image sensor die may be a backside illumination sensor die. The image sensor die may include an imaging device structure formed over a carrier layer. Through-silicon vias formed in the carrier layer may couple imaging device circuitry in the imaging device structure to conductive bumps on the carrier layer that are coupled to metal interconnects. A ball grid array may be formed on a surface of the package substrate that may be coupled to the conductive bumps. A glass lid may be attached to the image sensor die using attachment structures such that an air gap is formed between the glass lid and the image sensor die. Package sealing material may be deposited between the image sensor die and the package substrate.

Imaging systems with flip chip ball grid arrays

Decoupling capacitors are frequently used in computer systems in order to control noise. In general, decoupling capacitors are placed as close as possible to the devices they protect in order to minimize the amount of line inductance and series resistance between the devices and the capacitors. An integrated circuit package includes a substrate () having a first surface () and an opposing second surface (), and a die platform () adjacent to the first surface of the substrate. The substrate has a recess () therein. The integrated circuit package further includes a capacitor () in the recess of the substrate. The presence of a recess in the substrate provides an opportunity to reduce the separation distance between a die supported by the die platform and the decoupling capacitors. A further advantage of embodiments of the invention lies in its ability to maintain socket compatibility.

Integrated circuit package and method of manufacturing same

In one embodiment, the present invention includes a method for depositing lead-free bumps on a package substrate, depositing an alloy material on the lead-free bumps, attaching a semiconductor die including conductive bumps to the package substrate so that the conductive bumps contact the alloy material, and heating attached components to reflow the alloy material to form a joint therebetween. Other embodiments are described and claimed.

Reducing stress in a flip chip assembly

In some embodiments, an integrated circuit package includes a substrate and a heat spreader coupled to the substrate by fasteners. Thermal interface material thermally couples the die to the heat spreader. The heat spreader is provided over the die and is attached to the substrate with fasteners rather than a sealant-adhesive. Some examples of suitable fasteners may include rivets, barbed connectors, and gripping clips.

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Phoenix, AZ, United States of America

Oswald L Skeete