Kabushiki Kaisha Nihon Micronics

Osamu Takeuti

Mika Nasu

A probe includes: a rod-shaped plunger () including a tip section () and an insertion section () connected to the tip section (); a tube-shaped barrel () in which the insertion section () of the plunger () is located inside; and a conductive first fixing member () which is located in an area where the plunger () and the barrel () face each other and is configured to fix the plunger () to the barrel (), the first fixing member () having a lower melting point than that of the material of both of the plunger () and the barrel (). The gap between the plunger () and the barrel () is filled with the first fixing member () without any voids in a cross section of the probe in an area where the plunger () and the barrel () overlap each other, including the area where the first fixing member () is located.

Growing community of inventors

Oita, Japan

Osamu Takeuti