Fujitsu Corporation

Fujitsu Microelectronics Limited

Osamu Ōkano

Hideaki Konishi

Hitoshi Watanabe

Ryuji Shimizu

Koichi Itaya

Toshihito Shimizu

Junko Kumagai

Kazuyuki Yamamura

Naoko Karasawa

Takeshi Doi

Daisuke Tsukuda

Yuko Katoh

A test circuit tester includes a scan-chain input-output information generator that generates information for an input and an output of the scan chain that is scan-chain input-output information, based on input information for the scan chain; a test-circuit input-output information generator that generates information for an input and an output of the test circuit that is test-circuit input-output information, based on the scan-chain input-output information; an output unit that outputs the test-circuit input-output information generated; and a verifying unit that verifies the test circuit based on an output pattern output from the test circuit through the scan chains in response to input of the information for the input of the test circuit output to the test circuit, and the information for the output from the test circuit.

Test pattern generator, test circuit tester, test pattern generating method, test circuit testing method, and computer product

A design support apparatus includes a unit that inputs a user net list created by using hard macro cells excluding test circuits, and a unit that arranges hard macro cells using a frame into which hard macro cells, where timing-converged physical information includes test terminals, and test circuits are embedded as arrangement/wiring information. Moreover, includes a unit that arranges and wires the test circuits using the arrangement/wiring information of the test circuit embedded into the frame, a unit that recognizes arrangement/wiring information where the arrangement/wiring information of the test circuits is removed from arrangement/wiring information obtained by wiring, and a unit outputs a net list of a logic structure.

Method and apparatus for supporting designing of LSI, and computer product

Growing community of inventors

Kawasaki, Japan

Osamu Ōkano