Kawasaki Jukogyo Kabushiki Kaisha

Osamu Ohji

Katsumi Nakashima

Kenji Kasahara

Shogo Kojima

Keizo Watakabe

Yuuki Hanawa

Takashi Sakurai

Yohichi Nakamura

Shuhei Segawa

Toshihisa Doi

Tomoya Nakagawa

A circular scratch inspection apparatus includes: a camera capturing an image of a workpiece surface around a hole; illumination device emitting light to the workpiece surface around the hole, the light being reflected on the workpiece surface is not directly incident on the camera; and image processor. The image processor: generates a second-derivative image by performing secondary differentiation on luminance values in an actual image obtained by the camera; generates a second-derivative curve for each of a plurality of ruler lines, extending radially from the hole center and are set in an inspection target region on the workpiece surface; counts a first reference number of times for each ruler line; calculates a first reference total number of times; and determines presence or absence of a circular scratch by using the first reference total number of times.

Circular scratch inspection apparatus

A drilling apparatus includes: a table supporting a plate; a drill machining a through-hole in the plate; an annular pressing member pressing the plate around the through-hole; a camera capturing a plate surface image through an inner space of the pressing member; and a moving device moving the drill between machining and retraction positions, the machining position being at which the drill center coincides with the pressing member center, the retraction position being a position at which the drill is positioned outside a field of view of the camera. Insertion holes distributed in a circumferential direction are formed in the pressing member, and illumination devices, each emitting light to the plate surface around the through-hole, are inserted in the respective insertion holes. An optical axis direction of each of the illumination devices inserted in the respective insertion holes and the plate surface form an angle of 25 to 60&#xb0;.

Drilling apparatus

Provided are a method capable of discriminating between a colony of differentiated pluripotent stem cells and a colony of undifferentiated pluripotent stem cells, and a method for automatically culturing undifferentiated pluripotent stem cells and a system thereof. A differentiated colony composed of differentiated pluripotent stem cells, an undifferentiated colony composed of undifferentiated pluripotent stem cells and a multilayered colony having pluripotent stem cells stacked in multiple layers are discriminated by processing a photo image of a colony including pluripotent stem cells in a culture vessel. Specifically, a colony having a luminance higher than a first threshold A is determined as a differentiated colony, a colony having a luminance equal to or lower than the first threshold A and equal to or higher than a second threshold B is determined as an undifferentiated colony, and a colony having a luminance lower than the second threshold B is determined as a multilayered colony.

Method and apparatus for discriminating undifferentiated pluripotent stem cells, and automated culture method and system

A method and device achieves identification on whether a colony on a cultivation container is differentiated or undifferentiated on an occasion of cultivation of multipotent stem cell, and a method and device achieves a rapid culture of undifferentiated multipotent stem cells. Undifferentiated colony containing only undifferentiated multipotent stem cells is identified from other types of colonies by means of the circularity C of the colony in an image-processed taken image of the inside of cultivation container of a multipotent stem cell. More specifically, when a first threshold of the circularity of the colony is C, and a second predetermined threshold is C(C&#x3c;C), a colony satisfying C&#x2266;C is determined as the undifferentiated colony, a colony satisfying C&#x2266;C&#x3c;Cis determined as an undefined colony, and a colony satisfying C&#x3c;Cis determined as the differentiated colony.

Method and device for identifying multipotent stem cell colony, and method and device for automatically culturing multipotent stem cells

A novel method for evaluating cell detachment which can be used in passage operation and the like in culture of adhesive cells; a method of detaching a cultured cell utilizing the same; an apparatus for evaluating cell detachment for carrying out the aforementioned method for evaluating cell detachment; and an automated cell culture apparatus in which the apparatus is used are provided.

Method for evaluating cell detachment, method of detaching cultured cell, apparatus for evaluating cell detachment and automated cell culture apparatus

Growing community of inventors

Kako-gun, Japan

Osamu Ohji