Mitsubishi Denki Kabushiki Kaisha

Mitsubishi Denki K.k.

Hitachi Industrial Equipment Systems Co., Ltd.

Renesas Electronics Corporation

Hitachi, Ltd.

Hitachi-high-technologies Corporation

Renesas Technology Corp.

Roche Diagnostics Operations, Inc.

Hitachi High-tech Corporation

Junkosha Inc.

Mitsubishi Jidosha Kogyo Kabushiki Kaisha

Asahi Kasei Kabushiki Kaisha

Tokico, Ltd.

Shonan Chikka Kogyo Co, Ltd.

Osamu Matsumoto

Mamoru Sumida

Teruhiko Moriguchi

Toshio Kumamoto

Norihisa Fukutomi

Takeshi Obata

Tadahiro Shimozono

Kouji Obata

Koichiro Saito

Yutaka Okaue

Tsuyoshi Munezane

Masayuki Aota

Kazuyoshi Yamamoto

Fukashi Morishita

Takahiro Miki

Masao Ito

Hirokazu Maehara

Yuji Tanaka

Shinichi Takahashi

Tsutomu Tominaga

Shigeki Matsubara

Yukihiro Fujita

Masahiro Sano

Fridl Lang

Seiji Yanagisawa

Kenji Teshigawara

Toshihiko Yamamoto

Peter Wolf

Roland Ihrig

Tetsuji Kondo

Kouichi Satou

Sylvia Rosenblatt

Takashi Kimura

Setsuhiro Shimomura

Takashi Okuda

Yukinobu Nishimura

Yasuo Morimoto

Nobuaki Murakami

Seiji Wataya

Masayuki Ito

Tetsuji Kawahara

Masaharu Nishida

Yoshiaki Kanno

Kazuhiro Ueda

Mitsuharu Hashiba

Takashi Matsumoto

Yoko Inoue

Tateo Kume

Hideyuki Oda

Hiroto Suzuki

Shinji Kojima

Ryota Watanabe

Takao Kasai

Tatsuya Ikegami

Teruhiro Yamano

Kyoya Igarashi

Takashi Nakasawa

Sayaka Sarwar

Masanori Otsuka

Atsushi Watanabe

Tsuneo Yamane

Yuichiro Nagato

Kenichi Yagi

Toshiaki Yamaguchi

Hichiro Otani

Naoko Suwa

Sayaka Asada

Kazuhiro Shimada

Manabu Hirai

Chiaki Sugano

Masashi Hashimoto

Kazuyuki Ushio

Kouji Kajiyama

Katsuhiko Saito

Hiroshi Hujii

Takuro Kohyama

Takeji Yoshida

Hironobu Fukata

Takesi Omori

Tatsuo Horimoto

The automatic analyzer includes a first storage device that stores sample information including a measurement result of a reaction solution for each sample and a second storage device that stores the sample information on at least a part of the samples among the sample information stored in the first storage device, in which when the automatic analyzer reaches a predetermined operation state, the control device performs a backup process of backing up the sample information on the samples satisfying a predetermined backup condition from the first storage device to the second storage device, and deleting the sample information on the backed up samples from the first storage device.

Automatic analyzer

The automatic analyzer includes a storage unit storing the reaction containers of cleaning target by day unit in such a manner that all the reaction containers mounted on a reaction disk are to be cleaning target within a plurality of days, and a control unit exerts a control in such a manner that during an operation state after the sample of analysis object is dispensed to the reaction containers, a sample of analysis object in each of the reaction containers is analyzed, and not the sample but a detergent is dispensed to the reaction containers of cleaning target of an appointed day, the reaction containers of cleaning target of the appointed day being stored in the storage unit, to soak and wash the reaction containers for a certain time.

A solid-state imaging device capable of suppressing variations in reference voltages and improving performance of reference voltages is provided. According to one embodiment, the solid-state imaging device includes a pixel outputting a luminance signal voltage corresponding to an amount of incident light, reference voltages, a reference voltage generation circuit outputting a ramp signal and an inverse ramp signal, and an AD converter, and the AD converter includes a comparator including an amplifier coupled to one input terminal, a reference voltage and an input terminal coupled to each of the ramp signals via a capacitor, and an input terminal coupled to each of the reference voltage and the ramp signal via a capacitor, and a ramp current cancel circuit coupled to each of the reference voltages via a cancel capacitor.

Solid-state imaging device

There are provided a sterilization method and a sterilization device capable of effectively sterilizing a sterilization target having an uneven shape formed by a dented portion and a protruded portion. A sterilization method and a sterilization device configured to apply ultraviolet light to a sterilization target having an uneven shape formed by a dented portion and a protruded portion include plural light sources each including an LED element configured to apply ultraviolet light. Ultraviolet light is simultaneously applied from each of the plural LED elements in a state where the sterilization target arranged at previously set irradiation positions face the plural light sources, and reaches the sterilization target.

Sterilization method and sterilization device

Provided is a solid-state imaging device capable of increasing the speed of an A/D converter. The solid-state imaging device includes a successive approximation A/D converter that performs A/D conversion on an analog pixel signal. The successive approximation A/D converter includes a D/A converter, a comparator, and a successive approximation register. The D/A converter converts a digital reference signal to an analog reference signal. The successive approximation register operates based on the result of comparison by the comparator to generate the digital reference signal in such a manner that the analog reference signal approximates the analog pixel signal. The D/A converter includes a split capacitor, first capacitors, second capacitors, a switch array, a third capacitor, and a multiplexer. The first capacitors each have a first electrode coupled to the output node. The second capacitors are coupled to a second electrode of the split capacitor. The switch array is coupled to a second electrode of each of the first and second capacitors and is adapted to generate the analog reference signal at the output node by selectively applying a first reference voltage. The third capacitor is coupled to the second electrode of the split capacitor. The multiplexer is coupled to a second electrode of the third capacitor and is adapted to generate the analog reference signal at the output node by selectively applying a second reference voltage.

In a CMOS image sensor, a plurality of bias circuits are dispersedly arranged in an arrangement region of column circuits corresponding to each column of a pixel array. Each bias circuit generates a bias voltage on the basis of a reference current which has been input and supplies the generated bias voltage to the corresponding column circuitwhich is arranged in the vicinity. Thereby, luminance unevenness of a picked-up image caused by an IR drop of a ground wire for the column circuits is reduced.

Solid-state image pickup device with columns clustered into groups

An automatic analyzer achieves both restraining unnecessary usage of a consumable supply and reducing burdens on an operator in a re-execution processing in a case where pipe functions are suspended/stopped, and is capable of completely efficiently performing an analysis preparation processing or an analysis terminating processing. In the automatic analyzer, a storage unit stores information on pipe functions, and information on re-execution setting for setting a re-execution maintenance item from which re-execution is started with respect to a suspended maintenance item if pipe functions of a plurality of maintenance items are suspended halfway, and a computer sequentially executes the plurality of maintenance items, based on the information on pipe functions, and re-executes maintenance from the re-execution maintenance item associated with a suspended maintenance item, based on the suspended maintenance item and the information on re-execution setting, if the pipe functions of the plurality of maintenance items are suspended halfway.

An automatic analyzer includes: first reagent storing means for storing a plurality of the reagent containers; second reagent storing means for storing a replacement reagent container in addition to the first reagent storing means; transfer means for transferring the reagent container from the second reagent storing means to the first reagent means; and a storing portion for storing the reagent container discharged from the second reagent storing means. The automatic analyzer includes control means for exercising control such that the information write means writes reagent information on the information recording medium immediately before the reagent container is transferred from the second reagent storing means to the first reagent storing means or immediately before the reagent container is discharged from the second reagent storing means to the storing portion.

Unlike conventional reagent storing means of an analyzing unit having a cold-storage function, replacement reagent storing means having no cold-storage function requires reagent management of a higher order. An automatic analyzer is provided that manages the placing elapsed time for a reagent vessel in replacement reagent storing means 2, compares the placing elapsed time for the reagent with a permissible placing limit value stored as one of analysis parameters for each analysis item, and determines as to whether or not the placing elapsed time exceeds permissible limit value. In this way, the analyzer prevents the degradation of the reagent and automatically transfers the reagent to an analyzing section for performing measurement.

A coiled cable () has a conductor coil () formed into a coil shape having a coil average diameter (D) by winding four conductor base lines (-} with a diameter (d) to each of which art insulating coating layer () is applied. The conductor coil () is set to have an spring index (D/d) represented by 2&#x2266;D/d&#x2266;4, and each of the conductor base lines (-) is configured by twisting a plurality of materials that have &#x3c6;0.008 to &#x3c6;0.05 and that are made of tough pitch copper, oxygen-free copper, or copper alloy wire.

Coiled cable

A successive approximation register A/D converter that obtains an output of N bits interrupts operation at a timing when the operation of the successive approximation register A/D converter is affected on the basis of circuit timing in an integrated circuit. The A/D converter performs a comparison between a sampling signal and a comparison reference voltage by a sampling period in which an analog signal is sampled, a comparison period of N states in which the sampled signal is sequentially compared with a comparison voltage for each bit, and a reserve period of M states following the comparison period. When an operation is temporarily interrupted, the A/D converter performs a comparison operation of a bit, whereas the comparison is not performed in the reserve period.

Integrated circuit

A flat cable including thin coaxial cables each having a center conductor and a jacket, parallel arranged two-dimensionally in a flat shape, and joined by tangling them with a weft yarn in units of predetermined number of very thin coaxial cables. The flat cable further includes tangling yarns that are arranged parallel along the edges in the width direction of the thin coaxial cables, and the elongation of the weft yarn is greater than that of the tangling yarn. When the very thin flat cable is bent, the bent portion of the weft yarn is elongated, and thereby the bent portion of the very thin coaxial cables can deviate from the mesh formed by the very thin coaxial cables and the weft yarn.

Flat cable

A frequency converter for outputting a power to drive a motor, having: an inverter unit for inverting a d.c. power to an a.c. power; a control unit for controlling the inverter unit; and a housing for supporting at least the inverter unit and control unit, wherein a rise time change unit is provided in the housing, the rise time change unit changes a rise time of a waveform of a voltage output from the inverter unit.

Frequency converter, motor, motor drive system and maintenance method for motor drive system

Growing community of inventors

Tokyo, Japan

Osamu Matsumoto