Fujitsu Corporation

Fujitsu Semiconductor Limited

Osamu Igawa

Seiji Ueno

Hirohisa Matsuki

Mitsutaka Sato

Hideo Kubo

Tsuyoshi So

Tetsuya Fujisawa

Kazuhiko Kobayashi

Shigeyuki Maruyama

Kazuhiro Tashiro

Naoyuki Watanabe

Hideharu Sakoda

Yoshitaka Aiba

Masamitsu Ikumo

Makoto Iijima

Koju Aoki

Naohito Kohashi

Hiroyuki Sakima

Takaki Kurita

After a semiconductor chip is cut out, an In-10 atom % Ag pellet is placed on a metal film. Next, an epoxy sheet on a stiffener is stuck to a ceramic substrate. At this time, the In alloy pellet is sandwiched between a central protrusion portion and the metal film. Then, an In alloy film is formed from the In alloy pellet by heating, melting, and then cooling the In alloy pellet. As a result, the semiconductor chip and a heat spreader are bonded via the metal film and the In alloy film.

Semiconductor device and method for manufacturing the same

A semiconductor component includes a semiconductor element that has a plurality of signals, a wiring board that is disposed below the semiconductor element and that draws the plurality of signals of the semiconductor element, a heat conduction member that dissipates heat generated by the semiconductor element, a joining member that is disposed between the semiconductor element and the heat conduction member and that joins the heat conduction member to the semiconductor element, a support member formed with an opening so as to surround the semiconductor element that supports the heat conduction member, a first adhesive member that is disposed between the support member and the wiring board to bond the support member with the wiring board and a second adhesive member that is disposed between the support member and the heat conduction member to bond the support member with the heat conduction member.

Semiconductor component having adhesive squeeze-out prevention configuration and method of manufacturing the same

A semiconductor device includes a board, a semiconductor element mounted on one of main surfaces of the board, a plurality of passive elements provided in the vicinity of the semiconductor element, and a heat radiation plate mounted above the board and connected to a rear surface of the semiconductor element via a heat conductive material. A surface roughness of a surface of the heat radiation plate which surface comes in contact with the heat conductive material is non-uniform at a whole of the surface.

Semiconductor device

The present invention realizes a miniaturized electronic device that is still capable of maintaining its high reliability even when miniaturized. To this end, the electronic device has an electronic circuit, comprising: a substrate with a circuit formation surface on which one part of the electronic circuit is formed; a polyimide layer that is formed on the circuit formation surface; and a spiral inductor constituting another part of the electronic circuit, which is formed into a pattern on the polyimide layer.

Electronic device

In a semiconductor device circuit formation surfaces of each of a plurality of semiconductor chips can be easily located at even level when the semiconductor chips are arranged side by side so that a process of forming rearrangement wiring is simplified. The semiconductor chips are mounted on a substrate via an adhesive layer in a two-dimensional arrangement. A resin layer is formed on the substrate and located around the semiconductor elements. The resin layer has the same thickness as a thickness of the semiconductor elements. An organic insulating layer is formed over a surface of the resin layer and circuit formation surfaces of the semiconductor elements. A rearrangement wiring layer is formed on the organic insulating layer and electrodes of the semiconductor chips. External connection terminals are electrically connected to the circuit formation surfaces of the semiconductor elements through wiring in the rearrangement wiring layer.

Semiconductor device configured to be surface mountable

A contactor has a contactor substrate and a plurality of contact electrodes formed on the contactor substrate. Each contact electrode is formed by a metal wire bent between one end joined to the contactor substrate and the other end. An inclined plane is formed by a cutting surface. A fracture surface formed by a tension fracture is formed at the apex portion of the contact electrode.

Contactor, method for manufacturing such contactor, and testing method using such contactor

Growing community of inventors

Kawasaki, Japan

Osamu Igawa