Growing community of inventors

San Ramon, CA, United States of America

Oreste Donzella

Average Co-Inventor Count = 5.30

ph-index = 2

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 10

Oreste DonzellaDavid W Price (9 patents)Oreste DonzellaRobert J Rathert (9 patents)Oreste DonzellaChet V Lenox (8 patents)Oreste DonzellaJohn Charles Robinson (6 patents)Oreste DonzellaKara L Sherman (3 patents)Oreste DonzellaBin-Ming Benjamin Tsai (2 patents)Oreste DonzellaJaydeep K Sinha (2 patents)Oreste DonzellaPradeep Vukkadala (2 patents)Oreste DonzellaMike Von Den Hoff (2 patents)Oreste DonzellaBarry Saville (2 patents)Oreste DonzellaRobert Cappel (2 patents)Oreste DonzellaThomas Groos (2 patents)Oreste DonzellaJustin Lach (2 patents)Oreste DonzellaShifang Li (1 patent)Oreste DonzellaStilian Pandev (1 patent)Oreste DonzellaNaema Bhatti (1 patent)Oreste DonzellaTeng-Song Lim (1 patent)Oreste DonzellaDoug Sutherland (1 patent)Oreste DonzellaOreste Donzella (11 patents)David W PriceDavid W Price (13 patents)Robert J RathertRobert J Rathert (11 patents)Chet V LenoxChet V Lenox (8 patents)John Charles RobinsonJohn Charles Robinson (23 patents)Kara L ShermanKara L Sherman (4 patents)Bin-Ming Benjamin TsaiBin-Ming Benjamin Tsai (49 patents)Jaydeep K SinhaJaydeep K Sinha (36 patents)Pradeep VukkadalaPradeep Vukkadala (23 patents)Mike Von Den HoffMike Von Den Hoff (4 patents)Barry SavilleBarry Saville (4 patents)Robert CappelRobert Cappel (3 patents)Thomas GroosThomas Groos (2 patents)Justin LachJustin Lach (2 patents)Shifang LiShifang Li (71 patents)Stilian PandevStilian Pandev (63 patents)Naema BhattiNaema Bhatti (1 patent)Teng-Song LimTeng-Song Lim (1 patent)Doug SutherlandDoug Sutherland (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Kla Corporation (9 from 530 patents)

2. Kla Tencor Corporation (2 from 1,787 patents)


11 patents:

1. 12422376 - Imaging reflectometry for inline screening

2. 12332182 - System for automatic diagnostics and monitoring of semiconductor defect die screening performance through overlay of defect and electrical test data

3. 11899065 - System and method to weight defects with co-located modeled faults

4. 11798827 - Systems and methods for semiconductor adaptive testing using inline defect part average testing

5. 11754625 - System and method for identifying latent reliability defects in semiconductor devices

6. 11656274 - Systems and methods for evaluating the reliability of semiconductor die packages

7. 11624775 - Systems and methods for semiconductor defect-guided burn-in and system level tests

8. 11614480 - System and method for Z-PAT defect-guided statistical outlier detection of semiconductor reliability failures

9. 11293970 - Advanced in-line part average testing

10. 10788759 - Prediction based chucking and lithography control optimization

11. 10036964 - Prediction based chucking and lithography control optimization

Please report any incorrect information to support@idiyas.com
idiyas.com
as of
12/26/2025
Loading…