Koninklijke Philips Corporation N.v.

El-mul Technologies Ltd

Oren Zarchin

Ira Micah Blevis

Frank Verbakel

Semyon Shofman

Daniel Rubin

Oren Ofer

An imaging system () includes a radiation source () that emits radiation that traverses in a direction of an examination region () during a scan and a detector array () located opposite the radiation source, across the examination region, which detects radiation traversing the examination region during the scan and produces a signal indicative thereof. A beamshaper (), located between the radiation source and the examination region, defines a flux intensity profile of the radiation beam traversing the examination region. The beamshaper includes a plurality of x-ray attenuating elements(), which attenuate x-rays incident thereon, interleaved with a plurality of material free regions, which pass x-ray unattenuated. A transmittance of the x-rays is greater nearer a center region of the beamshaper relative to ends regions of the beamshaper. A beamshaper mover () translates the beamshaper during at least one acquisition interval of the scan.

Translating x-ray beam transmission profile shaper

A system () includes a photon counting detector array () including a direct conversion material () and a plurality of detector pixels () affixed thereto, and a split signal corrector () that corrects the output of the plurality of detector pixels for split signals. A method includes receiving an output signal of each of a plurality of detector pixels affixed to a direction conversion material of photon counting detector array, and correcting the output of the plurality of detector pixels for split signals. A computer readable storage medium encoded with computer readable instructions, which, when executed by a processer, cause the processor to: receive an output signal of each of a plurality of detector pixels affixed to a direction conversion material of photon counting detector array, and correct the output of the plurality of detector pixels for split signals.

Direct conversion radiation detector digital signal processing electronics

A system for selectively detecting charged particles produced due to operation of a charged particle beam column irradiating a specimen, including a proximal grid being selectively electrically biasable and configured for controllably directing the charged particles by electrically focusing the charged particles to compel selected secondary charged particles, whereupon being selected from the charged particles, to be attracted thereto, and to repel unselected secondary charged particles therefrom, a distal grid spaced apart from the proximal grid and separated therefrom by a gap and being selectively electrically biasable and configured for attracting the selected secondary and/or tertiary charged particles, whereupon being selected from the charged particles, to the distal grid, and to repel unselected tertiary charged particles therefrom, and a charged particle detector configured for detecting selected secondary charged particles attracted to the proximal and/or distal grid and detecting selected tertiary charged particles attracted to the distal grid, that impinge thereupon.

Growing community of inventors

Raanana, Israel

Oren Zarchin