USA as Represented by Secretary of the Navy

New Jersey Institute of Technology

Oren Sternberg

John D Rockway

Israel Perez

Mitchell Lerner

Jeffery C Allen

Haim Grebel

Nicholas T Johnson

Nicholas A Lumsden

Karl Dieter Moeller

Patrick Craig Sims

Brian Carl Hicks

Kenneth P Stewart

Mohammed Chergui

Sara R Wheeland

A true random number generator including a transistor, a first voltage source, a second voltage source, and a comparator. The transistor has a first electrode, a second electrode, and a third electrode. Two of the electrodes are electrically connected by a channel of conductive nanomaterial. The first voltage source is electrically connected to the first electrode and the second voltage source is electrically connected to the second electrode. The comparator is electrically connected to the third electrode and is configured to classify a measured electrical property at the third electrode as either HIGH or LOW based on a comparison of the measured electrical property with a reference value. The measured electrical property varies over time due to random telegraph signals (RTSs) due to defects in the transistor.

Nanomaterial-based true random number generator

A system includes a very low frequency (VLF) antenna connected to a circuit that has a high pass filter and a low pass filter. The circuit is configured for noise reduction and frequency localization of detected VLF signals. A receiver is configured to receive filtered VLF signals output by the circuit and to separate desired signals for processing. A display is configured to provide a user with visual feedback based at least in part on an even signature extracted by a digital signal processor (DSP).

System and method for very low frequency detection of an event signature

A signal evaluation system is provided for evaluating a first EM signal and a second EM signal for use in a passive coherent location system. The signal evaluation system includes: a spectrum detecting component that detects the first EM signal and the second EM signal; a signal characterization component that generates a first characterization of the first EM signal and to generate a second characterization of the second EM signal; and a ranking component that ranks the EM signals for use in the passive coherent location system. The first characterization is based on an amplitude associated with the first EM signal and one of range resolution, Doppler resolution, and combinations thereof associated with the first EM signal. The second characterization is based on an amplitude associated with the second EM signal and one of range resolution, Doppler resolution, and combinations thereof associated with the second EM signal.

Method for selecting signals of opportunity for passive coherent location

An optically detected power quality disturbance caused by a remote load is classified as belonging to a class of known classes of power quality disturbances. Features associated with different power quality disturbances that belong to a plurality of different known classes of power quality disturbances are learned. Cross-covariance is applied to the optically detected power quality disturbance and the different power quality disturbances that belong to the different known classes of power quality disturbances to recognize features of the optically detected power quality disturbance that at least partially match the learned features. The class of power quality disturbances among the plurality of classes of different known power quality disturbances to which the optically detected power quality disturbance belongs is determined based on the recognized features.

Methods and systems for classifying optically detected power quality disturbances

A method involves using one or more software programs to stress a powered electronic device in a test environment to induce controlled electromagnetic emissions from the powered electronic device, using the controlled electromagnetic emissions to generate an emission profile of the powered electronic device operating under stress, monitoring spurious electromagnetic emissions of the powered electronic device in an operational environment, and comparing the spurious electromagnetic emissions of the powered electronic device in the operational environment with the emission profile of the powered electronic device to determine that the powered electronic device is operating under stress in the operational environment.

Electronic device monitoring using induced electromagnetic emissions from software stress techniques

A non-periodic reflection beamsplitter or reflector for use in an interferometer. The interferometer employs non-periodic reflectors or a non-periodic beamsplitter in order to produce interference patterns to analyze. The non-periodic reflectors or beamsplitters may be concentrically arranged reflectors having equal area. The beamsplitter consists of two adjacent non-periodic structures having complementary reflection and transmission patterns.

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San Diego, CA, United States of America

Oren Sternberg