Bigband Networks Inc.

Applied Materials, Inc.

Applied Materials Israel Limited

Arris Solutions, Inc.

Oren Reches

Gilad Almogy

Nery Strasman

Ran M Oz

Amit Eshet

Doron Shoham

Amit Esbet

An apparatus and method for generating a multiplex of media streams, the method includes the steps of: (i) receiving a set of media streams that comprises first type media stream components and second type media stream components; (ii) applying a modification process that is not adapted to modify second type media stream components, such as to provide at least one modified first type media stream component; and (iii) multiplexing at least the second type media stream components and the modified first type media stream components.

Method and apparatus of multiplexing media streams

Method and apparatus of mutliplexing media streams

A method and system for providing video on demand, the method includes: (i) sending, by a resource manager, authorized media stream identification information to a modulation and radio frequency transmitter; (ii) receiving, by a radio frequency transmitter, at least one media stream encapsulated within addressable packets; wherein the at least one media stream is associated with corresponding received identification information; and (iii) determining, by the modulation and radio frequency transmitter, whether to modulate and transmit the received media stream in response to relationship between the authorized media stream identification information and between the receives identification information.

Method, transmitter and system for providing video on demand services

A method of inspecting a plurality of wafers in an optical inspection tool. The method includes the steps of generating a reference wafer and polishing the reference wafer in a chemical mechanical polishing process following a metal deposition process such that the reference wafer is representative of a fully polished wafer. The optical inspection tool scans the reference wafer and a gray level map is generated. A number of further wafers are metalized, polished, scanned and gray level maps generated. The method includes the step of comparing a gray level map of the scanned reference wafer to a number of gray level maps of the scanned wafers. A determination () is then made as to whether the wafer exhibits an acceptable polishing quality based on the comparison.

Wafer inspection methods and an optical inspection tool

A high data-rate electron beam spot-grid array imaging system is provided that overcomes the low resolution and severe linearity requirements of prior art systems. Embodiments include an imaging system comprising an electron beam generator for simultaneously irradiating an array of spots spaced apart from each other on a surface of an object to be imaged, and a detector for collecting backscattered and/or secondary electrons emitted as a result of the interaction of the spots with the surface of the object to form an image of the irradiated portions of the object surface. A mechanical system moves the substrate in a direction which is nearly parallel to an axis of the array of spots such that as the substrate is moved across the spot array in the scan direction (the y-direction) the spots trace a path which leaves no gaps in the mechanical cross-scan direction (the x-direction). A compensator, such as a servo or a movable mirror, compensates for mechanical inaccuracies in the moving stage, thereby increasing imaging accuracy. In other embodiments, multiple detectors placed at different angles to the substrate collect electrons to provide multiple perspective imaging of the substrate surface.

Spot grid array electron imaging system

A system and method for allowing an end-user to control a display of a media unit sequence by filtering a media unit sequence from a multiplexed sequence comprising a live media unit sequence and a plurality of delayed media unit sequences. The method includes the steps of: (1) Receiving a live media unit sequence. (2) Delaying the live media unit sequence by a plurality of delay periods thereby providing a delayed media unit sequence for each of said plurality of delay periods. (3) Modifying each delayed media unit sequence such that each delayed media unit sequence is distinguishable from another delayed media unit sequence and from the live media unit sequence. (4) Multiplexing the live media unit sequence and the plurality of delayed media unit sequences to generate a multiplexed sequence. (5) Transmitting the multiplexed sequence to at least one end user.

Method and system for generating and providing delayed media unit sequences to end-users

A high data-rate spot-grid array imaging system is provided that compensates for stage vibrations and overcomes the severe linearity requirements of prior art systems. Embodiments include an imaging system with a two-dimensional and periodic array of lenses, each lens imaging a spot in an object plane, such as a semiconductor substrate to be inspected, upon an image plane to image a two-dimensional and periodic array of spots. A sensor is provided in a conjugate image plane with a two-dimensional and periodic array of readout elements, each collecting the signal from one of the spots. A mechanical system moves the substrate in a direction which is nearly parallel to an axis of the array of spots such that as the substrate is moved across the spot array in the scan direction (the y-direction) the spots trace a path which leaves no gaps in the mechanical cross-scan direction (the x-direction). A compensator, such as a servo or a movable mirror, compensates for mechanical inaccuracies in the moving stage, thereby increasing imaging accuracy. In other embodiments, the motion of the mechanical system provides a small overlap between coverage areas of lenses of the lens array in consecutive columns, thereby overcoming the severe linearity requirements of prior art systems and allowing the utilization of cost effective microlens arrays.

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Zoran, Israel

Oren Reches