Microfabrica Inc.

Nevada Nanotech Systems Inc.

Onnik Yaglioglu

Dennis R Smalley

Richard T Chen

Jesse D Adams

Uri Frodis

Benjamin S Rogers

Ralph G Whitten

Will J Tan

Vaughn N Hartung

Nina C Levy

Jia Li

A method of calibrating a gas sensor comprises determining a sensitivity of a gas sensor to one or more conditions proximate the gas sensor, determining one or more initial calibration factors comprising a sensitivity of the gas sensor to one or more analytes of interest, determining a current sensitivity of the gas sensor to the one or more conditions proximate the gas sensor by measuring a response of the gas sensor while the one or more conditions proximate the gas sensor varies during operation of the gas sensor, and adjusting the one or more initial calibration factors of the gas sensor based, at least in part on the current sensitivity of the gas sensor to the one or more conditions proximate the gas sensor, and a relationship between the sensitivity of the gas sensor to the one or more analytes of interest to the sensitivity of the gas sensor to the one or more conditions proximate the gas sensor. Related gas detectors, related methods of compensating and calibrating the gas sensors, and methods of determining a functionality of the gas sensors are disclosed.

Methods of operating and calibrating a gas sensor, and related gas sensors

Embodiments of the present invention are directed to heat transfer arrays, cold plates including heat transfer arrays along with inlets and outlets, and thermal management systems including cold-plates, pumps and heat exchangers. These devices and systems may be used to provide cooling of semiconductor devices or other devices and particularly such devices that produce high heat concentrations. The heat transfer arrays may include microjets, multi-stage microjets, microchannels, fins, wells, wells with flow passages, well with stress relief or stress propagation inhibitors, and integrated microjets and fins.

Micro heat transfer arrays, micro cold plates, and thermal management systems for semiconductor devices, and methods for using and making such arrays, plates, and systems

Probe structures, probe arrays, have varying intrinsic material properties along their lengths. Methods of forming probes and probe arrays comprise varying the plating parameters to provide varying intrinsic material properties. Some embodiments provide deposition templates created using multiphoton lithography to provide probes with varying lateral configurations along at least portion of their lengths.

Method of in situ modulation of structural material properties and/or template shape

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Thousand Oaks, CA, United States of America

Onnik Yaglioglu