Commissariat a L'energie Atomique Et Aux Energies Alternatives

Ondrej Mandula

Cedric Allier

Thomas Bordy

Cédric Allier

Olivier Cioni

Camille Deforceville

A method for analyzing microorganisms arranged in a sample is provided, the sample including a viability marker to modify an optical property of the microorganisms in different ways depending on whether they are dead or alive, the method including illumination of the sample and acquisition of an image of the latter by an image sensor, the image sensor then being exposed to an exposure light wave; determining positions of different microorganisms from the acquired image; applying a propagation operator to calculate at least one characteristic value of the exposure light wave at each radial position and at a plurality of distances from the detection plane representing a change in the characteristic value between the image sensor and the sample; and identifying living microorganisms according to each profile.

Method for analysing microorganisms

Device for observing a sample, comprising:

Method for observing a sample in two spectral bands, and at two magnifications

The invention relates to a method for observing a fluorescent sample lying in a sample plane, where the sample comprises a fluorescent agent able to emit a fluorescence light wave in a fluorescence spectral band when it is illuminated by an excitation light wave, in an excitation spectral band. The method includes illuminating the sample using a first light source, in a first illumination spectral band in the excitation spectral band, and acquiring a first image of the sample, in the fluorescence spectral band, using an image sensor; and illuminating the sample using a second light source, in a second spectral band, outside of the fluorescence spectral band, and acquiring a second image of the sample, in the second spectral band, using the image sensor. The image sensor is coupled to an optical system such that in the fluorescence spectral band, the object focal plane of the optical system is coincident with the plane of the sample; and in the second spectral band, the object focal plane of the optical system is offset with respect to the plane of the sample.

Growing community of inventors

Grenoble, France

Ondrej Mandula