Shutterfly, Inc.

Omer Moshe Moussaffi

A photo design smart assistant system for reducing similar photos for display and product design includes a similarity distance computation module that can calculate hash values of images and to calculate similarity distances between the images using at least the hash values, a burst grouping module that can automatically group the images into a burst based at least in part on the similarity distances of the images, wherein at least one image is automatically selected from the burst of images, an intelligent design creation engine that can automatically create a photo product design using the selected image from the burst, and a printing and finishing facility that can automatically make a physical photo product based on the photo product design.

System and method for reducing similar photos from display and product design

System and method for reducing similar photos for display and product design

A computer system selects a kernel and kernel parameters for a first Support Vector Machine (SVM) model, testing the SVM model on a feature matrix T of n feature vectors of length m to produce false positive (FP) data set and false negative (FN) data set by a computer processor, wherein n and m are integer numbers, copies the feature matrix T to produce a feature matrix T_best, and checking if a ratio (T_best sample number)/(SVM support vector number) is above a threshold for the SVM model on T_best. If the ratio is above the threshold, SVM predictions are performed using the SVM model on the feature matrix T_best. The first SVM model can be used classify the faces or the objects in the images. An image-product design can be created based on the faces or the objects in the images classified by the first SVM model using the feature matrix T_best.

Support vector machine prediction system

A computer-implemented method includes selecting a kernel and kernel parameters for a first Support Vector Machine (SVM) model, testing the first SVM model on a feature matrix T of n feature vectors of length m to produce false positive (FP) data set and false negative (FN) data set by a computer processor, wherein n and m are integer numbers, automatically removing feature vectors corresponding to the FP data set from the feature matrix T by the computer processor to produce a feature matrix T_best, retraining the first SVM model on the feature matrix T_best to produce a second SVM model, and checking if a ratio (T_best sample number)/(SVM support vector number) is above a threshold for the second SVM model on T_best. If the ratio is above the threshold, SVM predictions are performed using the second SVM model on the feature matrix T_best.

High recall additive pattern recognition for image and other applications

A computer-implemented method is disclosed for image recognition and other applications. The method employs an SVM model and can reduce false negatives and increase recognition accuracies by raising the sample-to-support-vector ratio.

System for support vector machine prediction

A computer-implemented method includes selecting a kernel and kernel parameters for a first Support Vector Machine (SVM) model, testing the first SVM model on a feature matrix T of n feature vectors of length m to produce false positive (FP) data set and false negative (FN) data set by a computer processor, wherein n and m are integer numbers, automatically removing feature vectors corresponding to the FN data set from the feature matrix T by the computer processor to produce a feature matrix T_best of size (n-size(FN))*m, retraining the first SVM model on the feature matrix T_best to produce a second SVM model, and checking if a ratio (T_best sample number)/(SVM support vector number) is above a threshold for the second SVM model on T_best. If the ratio is above the threshold, SVM predictions is performed using the second SVM model on the feature matrix T_best.

High precision additive pattern recognition for image and other applications

A computer-implemented method includes selecting a kernel and kernel parameters for a first Support Vector Machine (SVM) model, testing the SVM model on a feature matrix T of n feature vectors of length m to produce false positive (FP) data set and false negative (FN) data set by a computer processor, wherein n and m are integer numbers, copying the feature matrix T to produce a feature matrix T_best, and checking if a ratio (T_best sample number)/(SVM support vector number) is above a threshold for the SVM model on T_best. If the ratio is above the threshold, SVM predictions are performed using the SVM model on the feature matrix T_best. The first SVM model can be used classify the faces or the objects in the images. An image-product design can be created based on the faces or the objects in the images classified by the first SVM model using the feature matrix T_best.

Support vector machine prediction method

A computer-implemented method includes selecting a kernel and kernel parameters for a first Support Vector Machine (SVM) model, testing the first SVM model on a feature matrix T of n feature vectors of length m to produce false positive (FP) data set and false negative (FN) data set by a computer processor, wherein n and m are integer numbers, automatically removing feature vectors corresponding to the FP data set from the feature matrix T by the computer processor to produce a feature matrix T_best of size (n-size(FN))*m, retraining the first SVM model on the feature matrix T_best to produce a second SVM model, and checking if a ratio (T_best sample number)/(SVM support vector number) is above a threshold for the second SVM model on T_best. If the ratio is above the threshold, SVM predictions are performed using the second SVM model on the feature matrix T_best.

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Haifa, Israel

Omer Moshe Moussaffi