Average Co-Inventor Count = 3.02
ph-index = 1
The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.
Company Filing History:
1. Commissariat À L'Énergie Atomique Et Aux Énergies Alternatives (20 from 4,874 patents)
2. Centre National De La Recherche Scientifique (5,089 patents)
3. Teem Photonics, Inc. (12 patents)
4. Guard Industrie (0 patent)
20 patents:
1. 11358091 - Gas treatment system having increased service life
2. 11123795 - Particle for making metal parts using 3D printing and method for making metal parts
3. 10710337 - Metal and/or ceramic microlattice structure and its manufacturing method
4. 10576540 - Method and machine for additive manufacturing reducing risks of powder dissemination during manipulations
5. 10357799 - Method for producing a substrate by spraying particles onto a compact film of solid particles on a carrier liquid
6. 10040095 - Method for orienting elongated objects arranged on a surface of a substrate
7. 10010906 - Process for depositing a compact film of particles on the internal surface of a part having a hollow delimited by this internal surface
8. 9962729 - Installation and method with improved performance for forming a compact film of particles on the surface of a carrier fluid
9. 9885692 - Method for producing a chromatography-enrichment column
10. 9873227 - Method for transferring objects onto a substrate using a compact particle film, including a step of producing connectors on the objects
11. 9835599 - Method for producing a chromatography analysis column
12. 9802217 - Installation and method with improved performance for forming a compact film of particles on the surface of a carrier fluid
13. 9751105 - Facility and method for depositing a width adjustable film of ordered particles onto a moving substrate
14. 9744557 - Method for forming a film of particles on a carrier liquid, with movement of an inclined ramp for compressing the particles
15. 9652865 - Optical method for characterizing a diffractive surface and apparatus for implementing such a method