Growing community of inventors

Palo Alto, CA, United States of America

Oliver Schmidt

Average Co-Inventor Count = 3.15

ph-index = 22

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 989

Oliver SchmidtPeter Kiesel (38 patents)Oliver SchmidtMichael Bassler (18 patents)Oliver SchmidtNoble Marshall Johnson (11 patents)Oliver SchmidtSandro Francesco Tedde (5 patents)Oliver SchmidtAndreas Kanitz (4 patents)Oliver SchmidtPatrick Yasuo Maeda (3 patents)Oliver SchmidtMeng H Lean (3 patents)Oliver SchmidtOliver Hayden (3 patents)Oliver SchmidtUma Srinivasan (3 patents)Oliver SchmidtOliver Wolst (3 patents)Oliver SchmidtRichard H Bruce (2 patents)Oliver SchmidtArmin Rainer Völkel (2 patents)Oliver SchmidtChristian G Van De Walle (2 patents)Oliver SchmidtBernd Spruck (2 patents)Oliver SchmidtDavid Hartmann (2 patents)Oliver SchmidtLukas Richter (2 patents)Oliver SchmidtRene Fischer (2 patents)Oliver SchmidtChristian Koos (2 patents)Oliver SchmidtPatric Buechele (2 patents)Oliver SchmidtAli Kamen (1 patent)Oliver SchmidtArmin R Volkel (1 patent)Oliver SchmidtMichael A Kneissl (1 patent)Oliver SchmidtThomas Engel (1 patent)Oliver SchmidtHuangpin Ben Hsieh (1 patent)Oliver SchmidtManfred Stanzel (1 patent)Oliver SchmidtEnrico Geissler (1 patent)Oliver SchmidtNoha Youssry El-Zehiry (1 patent)Oliver SchmidtMarcus Radicke (1 patent)Oliver SchmidtStefan Richter (1 patent)Oliver SchmidtFrank Hoeller (1 patent)Oliver SchmidtCristina Alvarez Diez (1 patent)Oliver SchmidtManfred Rührig (1 patent)Oliver SchmidtFrank Höller (1 patent)Oliver SchmidtH Ben Hsieh (1 patent)Oliver SchmidtGaby Marquardt (1 patent)Oliver SchmidtLars-Christian Wittig (1 patent)Oliver SchmidtMatthias Ugele (1 patent)Oliver SchmidtRainer Gransee (1 patent)Oliver SchmidtManfred Ruehrig (1 patent)Oliver SchmidtDaniela Seidel (1 patent)Oliver SchmidtSimon Brattke (1 patent)Oliver SchmidtPeter Michael Dueppenbecker (1 patent)Oliver SchmidtKiesel Peter (1 patent)Oliver SchmidtSetu Mohta (1 patent)Oliver SchmidtArnd Willy Walter Geis (1 patent)Oliver SchmidtVishnu Vatheriparambil Mohandas (1 patent)Oliver SchmidtMichael A Kneissl (0 patent)Oliver SchmidtOliver H Wolst (0 patent)Oliver SchmidtOliver H Wolst (0 patent)Oliver SchmidtOliver Schmidt (52 patents)Peter KieselPeter Kiesel (139 patents)Michael BasslerMichael Bassler (38 patents)Noble Marshall JohnsonNoble Marshall Johnson (100 patents)Sandro Francesco TeddeSandro Francesco Tedde (18 patents)Andreas KanitzAndreas Kanitz (40 patents)Patrick Yasuo MaedaPatrick Yasuo Maeda (87 patents)Meng H LeanMeng H Lean (83 patents)Oliver HaydenOliver Hayden (27 patents)Uma SrinivasanUma Srinivasan (18 patents)Oliver WolstOliver Wolst (4 patents)Richard H BruceRichard H Bruce (61 patents)Armin Rainer VölkelArmin Rainer Völkel (26 patents)Christian G Van De WalleChristian G Van De Walle (22 patents)Bernd SpruckBernd Spruck (17 patents)David HartmannDavid Hartmann (11 patents)Lukas RichterLukas Richter (9 patents)Rene FischerRene Fischer (3 patents)Christian KoosChristian Koos (3 patents)Patric BuechelePatric Buechele (2 patents)Ali KamenAli Kamen (103 patents)Armin R VolkelArmin R Volkel (82 patents)Michael A KneisslMichael A Kneissl (58 patents)Thomas EngelThomas Engel (41 patents)Huangpin Ben HsiehHuangpin Ben Hsieh (32 patents)Manfred StanzelManfred Stanzel (31 patents)Enrico GeisslerEnrico Geissler (22 patents)Noha Youssry El-ZehiryNoha Youssry El-Zehiry (22 patents)Marcus RadickeMarcus Radicke (22 patents)Stefan RichterStefan Richter (17 patents)Frank HoellerFrank Hoeller (9 patents)Cristina Alvarez DiezCristina Alvarez Diez (8 patents)Manfred RührigManfred Rührig (7 patents)Frank HöllerFrank Höller (7 patents)H Ben HsiehH Ben Hsieh (6 patents)Gaby MarquardtGaby Marquardt (6 patents)Lars-Christian WittigLars-Christian Wittig (6 patents)Matthias UgeleMatthias Ugele (6 patents)Rainer GranseeRainer Gransee (4 patents)Manfred RuehrigManfred Ruehrig (4 patents)Daniela SeidelDaniela Seidel (4 patents)Simon BrattkeSimon Brattke (2 patents)Peter Michael DueppenbeckerPeter Michael Dueppenbecker (2 patents)Kiesel PeterKiesel Peter (1 patent)Setu MohtaSetu Mohta (1 patent)Arnd Willy Walter GeisArnd Willy Walter Geis (1 patent)Vishnu Vatheriparambil MohandasVishnu Vatheriparambil Mohandas (1 patent)Michael A KneisslMichael A Kneissl (0 patent)Oliver H WolstOliver H Wolst (0 patent)Oliver H WolstOliver H Wolst (0 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Palo Alto Research Center Inc. (39 from 2,078 patents)

2. Siemens Healthcare Gmbh (8 from 2,339 patents)

3. Siemens Aktiengesellschaft (2 from 30,045 patents)

4. Carl Zeiss Ag (2 from 209 patents)

5. Siemens Healthcare Diagnostics Gmbh (1 from 709 patents)


52 patents:

1. 11158436 - Filter system for the local attenuation of X-radiation, X-ray apparatus and method for locally changing the intensity of X-radiation

2. 11106028 - Microscopy device

3. 10874366 - Mammography imaging

4. 10801944 - High accuracy 5-part differential with digital holographic microscopy and untouched leukocytes from peripheral blood

5. 10408735 - In vitro method for the label-free determination of a cell type of a cell

6. 10340465 - Perovskite particles for producing X-ray detectors by means of deposition from the dry phase

7. 10263043 - Coating made of a semiconductor material

8. 9983319 - Detection layer comprising perovskite crystals

9. 9874642 - Scintillators comprising an organic photodetection shell

10. 9869773 - Hybrid-organic X-ray detector with conductive channels

11. 9638637 - Method and system implementing spatially modulated excitation or emission for particle characterization with enhanced sensitivity

12. 9329027 - Measuring unit, measuring system and method for determining a relative position and relative orientation

13. 9299470 - Arrangement and method for modifying the local intensity of x-ray radiation

14. 9164037 - Method and system for evaluation of signals received from spatially modulated excitation and emission to accurately determine particle positions and distances

15. 8821799 - Method and system implementing spatially modulated excitation or emission for particle characterization with enhanced sensitivity

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12/24/2025
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