Robert Boschgmbh

Oliver Schatz

Joerg Muchow

Jiri Marek

Christian Ohl

Bernhard Jakoby

Hans-Peter Trah

Boris Adam

Bernhard Opitz

Matthias Illing

Uwe Guenther

Adolf Kugelmann

Vinko Marolt

Stephan Buch

Joachim Horn

A device for testing at least one pressure sensor, by applying a pressure signal, the device testing the operativeness of the pressure sensor as a function of the pressure signal. In addition, it is provided that the device tests the tightness of the pressure sensor as a function of the pressure signal.

Device for testing at least one pressure sensor

An apparatus for supplying energy to a sensor co-moved with a wheel of a vehicle, which contains a generator co-moved with the wheel of the vehicle, the generator generating electrical energy from vibrational motions of the vehicle.

Method and apparatus for supplying energy to sensors

A method for determining the instantaneous temperature of a medium, the medium surrounding an element able to be electrically heated at least intermittently to a constant, known temperature. It is provided for the instantaneous temperature of the medium to be determined from a heating power supplied to the element.

Method for determining the instantaneous temperature of a medium

A method for assessing the deterioration of motor oil is provided, in which the oil viscosity of the motor oil is measured by a sensor, and the length of an oil-change interval is determined in an evaluating electronics having a display device. According to the present invention, it is provided that a temperature sensor for the simultaneous determination of the oil temperature is assigned to the sensor for measuring the oil viscosity, and the oil viscosity and oil temperature are measured in the cooling phase of the engine after it has been switched off.

Method for assessing the deterioration of motor oil

A circuit arrangement is described for compensating temperature non-linearity of the characteristics of piezoresistive, metallic or polycrystalline resistors (bridge resistors) connected in a bridge circuit, the non-linearities being caused by non-linearities of the resistors, in particular due to the physical quantities affecting the bridge circuit (temperature, pressure, bimetal effects, non-linear membrane stresses), and the resistors being composed of partial resistors having different temperature coefficients, with each of the partial resistors having a certain linear and non-linear temperature response. The partial resistors of each bridge resistor are selected on the basis of their known linear and non-linear temperature characteristics so that an asymmetric layout of the bridge circuit is obtained and a non-linear variation of a bridge output voltage of the circuit arrangement can be essentially compensated.

Circuit configuration for compensating the temperature non-linearity of the characteristic curves of the piezoresistive measuring resistors connected in a bridge circuit

A pressure sensor is based, in part, on the piezoresistive effect. In this, a pressure acting from outside effects a deformation of a resistor, arranged on a membrane, whose resistance changes as a result of that deformation. Since this resistor reacts with similar sensitivity to a deformation resulting from an internal mechanical interference stress, an arrangement is proposed which, with the aid of a compensation resistor, abolishes the effect of the internal mechanical interference stress. This arrangement serves, among other purposes, to compensate for temperature hystereses in integrated sensors, that hysteresis being caused principally by metallization planes in the pressure sensor and by temperature-related creep thereof.

Pressure sensor for semi-conductor

A circuit arrangement implemented as an integrated semiconductor component has a measured value acquisition circuit that can be connected to an analysis circuit, in particular a piezoresistive measuring bridge containing piezoresistive measuring shunts diffused on a semiconductor substrate. The piezoresistive measuring shunts are connected to metallic terminal contacts by diffused terminal resistors having a negligible piezoresistive resistance. To avoid terminal-related offset errors on the measuring shunts in particular, the terminal resistors are designed as identical, elongated, generally curved area structures that taper toward the front end and are connected to a measuring shunt on the front end and to a metallic terminal contact on the opposite end.

Semiconductor component with piezoresistive measuring shunts

A circuit arrangement for amplifying a differential voltage signal in an output signal proportional to a voltage difference is provided, the voltages of a signal source that are to be compared being present at two inputs of the circuit arrangement, and a current signal proportional to the voltage difference being present at one output of the circuit arrangement, the circuit arrangement comprising cross-coupled transistors and the inputs being respectively connected to the base of one of the transistors, and a cross current of the circuit arrangement being present at the output. A compensation circuit is provided having a temperature behavior which corresponds to the temperature behavior of cross resistances of the circuit arrangement, the compensation circuit being associated with each of the inputs of the circuit arrangement.

Circuit arrangement for amplifying a differential voltage signal which has a substantially temperature independent characteristic curve

A method and an apparatus for calibrating an integrated circuit by blowing a fusible link. A blowing current is caused to flow through the fusible link via a switch element. When the fusible link blows to render it nonconductive, a sudden voltage pulse appears which is detected by a differentiating element and utilized to quickly turn off the switch element and, thereby, avoid damage to the integrated circuit.

Method and apparatus for calibrating integrated circuits

The invention is a circuit arrangement for evaluating a capacitive signal from an acceleration sensor, in which an acceleration-dependent capacitance change is evaluated by measuring the voltage at the oscillator. After each voltage change, the charge of the two capacitor elements of a differential capacitor is neutralized by applying a predetermined voltage, preferably the operating voltage. When a new acceleration occurs, a voltage difference relative to the predetermined voltage is again determined. The voltage difference is converted into a pulse-width modulated signal and is used for supplying the two capacitor elements of the acceleration sensor. The circuit arrangement is preferably usable for activating an air bag in a motor vehicle.

Circuit arrangement for evaluating an acceleration sensor signal

An integrated semiconductor device having a thyristor includes outer npn-transistors, outer pnp-transistors, and an inner npn-transistor. The outer pnp-transistors and the inner npn-transistor are interconnected so as to form a thyristor to allow the inner transistor to be biased into conduction. Furthermore, a current flow takes place via the outer npn-transistors and the inner npn-transistor. The integrated semiconductor device having a thyristor minimizes interference produced in neighboring components.

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Reutlingen, Germany

Oliver Schatz