Johann Wolfgang Goethe-Universitat

Oliver Klein

Werner Mäntele

Vitali Vogel

Lea Schröder

A measuring device determines the size, size distribution, and/or concentration of nanoscopic particles or hollow spaces in a measuring sample, the degree of opacity of such measuring samples, or the degree of roughness of surfaces by determining the wavelength and scattering angle dependent intensities of a measuring radiation scattered on a measuring sample. The measuring device comprises a retaining device for a measuring sample to be measured, a detector comprising at least one detector inlet, an evaluation unit, and at least two radiation sources that are respectively at a distance from each other and at a distance from the measuring sample. Via the radiation sources, a ray bundle can in each case be emitted in an essentially parallel beam in the direction of the measuring sample. The ray bundles directed onto the measuring sample are aligned or can be aligned in different angles onto the measuring sample.

Growing community of inventors

Friedberg, Germany

Oliver Klein