Atg Test Systems Gmbh & Co. Kg

Atg Luther & Maelzer Gmbh

Oleh Yuschuk

Victor Romanov

Uwe Rothaug

Christian Weindel

Stefan Weiss

The invention relates to a test needle for measuring electrically conductive layers in holes of printed circuit boards, as well as to a test probe equipped with such a test needle and to a flying probe tester for testing printed circuit boards equipped with such a test needle or such a test probe. The test needle has a capacitive measuring body, which is connected via a cable to a capacitive measuring device. The cable is shielded so that only the capacitive measuring body can form a capacitive coupling with other electrically conductive bodies. This makes it possible to determine this capacitive coupling with a high local resolution.

Capacitive test needle for measuring electrically conductive layers in printed circuit board holes

A method of testing circuit boards, in particular non-componented circuit boards in which the level of the surface of a circuit board to be tested is detected automatically in a contacting process, and the further contacting operations are then controlled on the basis of the level detected. By this process, the control of the movement of the test probes of the finger tester effects automatic matching to the level, which is of particular advantage in the testing of flexible circuit boards, since their surface may have a three-dimensional form.

Method for testing non-componented circuit boards

An apparatus and a method for the testing of circuit boards, together with a test probe for this apparatus and this method, in which the contact tips of a test finger of a finger tester are monitored during the testing process by an optical detection device and their movement, at least when approaching a part of the circuit board test points of a circuit board to be tested, is corrected on the basis of the result determined by the optical detection device in such a way that the contact tip makes reliable contact with the circuit board test point concerned. The correction data hereby obtained may be used in the calculation of calibration data.

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Wertheim-Reicholzheim, Germany

Oleh Yuschuk