Jpk Instruments Ag

Olaf Sünwoldt

Detlef Knebel

Torsten Jähnke

Heiko Haschke

The invention relates to a device for receiving a test sample, particularly sample holders for combined examination of the test sample by a test procedure combined with another test procedure, which differs from the first test procedure, with a planar preparation component () in a transparent material with a preparation surface on which the test sample can be prepared, wherein a test path for the introduction of a test facility for carrying out the test procedure is formed on one side of the preparation component () and another test path for the introduction of a test facility for carrying out the other test procedure on the test sample is formed on an opposite side of the preparation component (), wherein a supporting and covering element () which has an aperture () through which the test path is formed is pressed against the preparation component () on one side (FIG.).

Device for receiving a test sample

The invention relates to an apparatus and a method for a scanning probe microscope, comprising a measuring assembly which includes a lateral shifting unit to displace a probe in a plane, a vertical shifting unit to displace the probe in a direction perpendicular to the plane, and a specimen support to receive a specimen. A condenser light path is formed through the measuring assembly so that the specimen support is located in the area of an end of the condenser light path.

Apparatus and method for a scanning probe microscope

The invention relates to a probe () mounting device for a scanning probe microscope, especially a scanning force microscope, comprising a retaining member () for installation in a measuring assembly of a scanning probe microscope. The probe () is detachably mounted on the retaining member () by means of a clamping member (), the clamping member being secured in self-locking fashion to the retaining member ().

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Berlin, Germany

Olaf Sünwoldt