Infineon Technologies Ag

Olaf Stroeble

Heinz Mattes

Sebastian Sattler

Thomas Piorek

An electrical circuit used for measuring times is disclosed. In one embodiment, the electrical circuit has a counter, a decoder and a multiplicity of time trap elements. At least the counter and the time trap elements are located together on an integrated semiconductor component. Each time trap element has a data input, a clock input, a delay output and a output port. The time trap element contains a delay element and a flip flop. The delay element outputs a signal change at the data input with a time delay at the delay output. The flip flop has a data input, a clock input and an output port, the data inputs, the clock inputs and the output ports of the flip flop and of the time trap element being connected to one another. The time trap elements are connected as ring oscillator.

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Planegg, Germany

Olaf Stroeble