Witec Wissenschaftliche Instrumente Und Technologie Gmbh

Forschungszentrum Julich Gmbh

Witec Gmbh

Tescan Group, A.s.

Olaf Hollricher

Peter Spizig

Christoph Buchal

Jaroslav Jiruse

Wolfram Ibach

Detlef Sanchen

Gerhard Volswinkler

Klaus Rademacher

Frank Ruders

Hartmut Roskos

Jens Peter Hermanns

Elard Stein Von Kamienski

Wofram Ibach

Martin Hanicinec

A method and a device are provided which enables a simple and fast Raman and/or fluorescence measurement even on uneven specimen surfaces; additionally, the invention should make it possible to confocally image a plane or a surface, in particular a surface of a specimen, i.e. with the aid of confocal microscopy.

Method and device for imaging a specimen surface

A device for imaging the surfaces of a sample having topography with the aid of confocal microscopy, in particular confocal Raman and/or fluorescence microscopy, comprising a first light source, in particular a laser light source for generating excitation radiation, in particular Raman radiation and/or fluorescence radiation and a second light source, wherein the first laser light source emits radiation in a first wavelength range and the second light source emits radiation in a second wavelength range, wherein the first wavelength range and the second wavelength range do not overlap.

Device for imaging a sample surface

The invention relates to an apparatus and a method for imaging surface area of a sample having a surface topography with the aid of confocal microscopy, such as confocal Raman and/or fluorescence microscopy. The apparatus comprises a surface topography sensor that provides values for the surface topography. The surface topography values allow for the surface to be maintained in the confocal plane during scanning.

Apparatus for imaging a sample surface

Optoelectronic diode and component containing same

Growing community of inventors

Neu-Ulm, Germany

Olaf Hollricher