Ampere Computing LLC

Macom Connictivity Solutions, LLC

Ojas Dharia

Alfred Yeung

Ronen Cohen

Vamsi Srikantam

Subbayyan Venkatesan

Manoj Kulkarni

A metal-insulator-metal (MIM) capacitor design methodology and system substantially maximizes the benefits of including MIM capacitors in an integrated circuit design while substantially minimizing the negative impacts resulting from increased capacitance. A process analysis is performed on an integrated circuit design to determine a metal layer that is likely to be most adversely affected by the presence of MIM capacitor cells. The MIM capacitor cells are then designed to have specific sizes and orientations based on results of the process analysis, taking the most affected metal layer into consideration. Finally, the MIM capacitor cells are placed at selected locations on the die in an algorithmic fashion in order to satisfy a design target of maximizing coverage area while avoiding interference with signal paths and critical or sensitive components.

MIMCAP creation and utilization methodology

Techniques efficiently improve circuit design to reduce its sensitivity to random device variation. A characterizer component can identify a subset of cells for an integrated circuit that can be representative of respective other cells of a set of cells. The characterizer component can analyze the representative cells of the subset to generate a variation profile, and can map the representative cells to physical cells used in the design of the circuit. A cell library comprising cells that are usable, have limited usage, and/or have general usage can be generated based on analysis results from the mapped cells. The circuit can be reconstructed based on the list of available cells using the cell library. The reconstructed circuit can be analyzed, and in case of a cell(s) violating a constraint, the cell(s) can be modified or enhanced to achieve target performance criteria.

Efficient techniques for process variation reduction for static timing analysis

MIMcap creation and utilization methodology

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Santa Clara, CA, United States of America

Ojas Dharia