Samsung Electronics Co., Ltd.

Oh-suk Kwon

June Hyung Lee

Soon-Young Kim

Hyun-chul Ha

Integrated circuit devices include operational circuits that are configured to operate from power supply voltages and from high voltages that are generated in the integrated circuit device from the power supply voltages. A circuit for measuring the high voltages is also provided in the integrated circuit. The circuit includes a common high voltage measurement pad and high voltage switch units connected to the common high voltage measurement pad. A respective high voltage switch unit is configured to transmit a corresponding one of the high voltages to the common high voltage measurement pad in response to a corresponding enable signal. The operational circuits may be non-volatile memory cells, such as flash memory cells. Related methods of measuring high voltages in an integrated circuit device are also described.

Measuring high voltages in an integrated circuit using a common measurement pad

A program method of a non-volatile memory device comprises setting a string select line to a predetermined voltage, setting a selected word line to a program voltage and unselected word lines to a pass voltage respectively. The program voltage is varied according to an arrangement of the selected word line. Problems arising from capacitive coupling between adjacent signal lines are alleviated.

Program method of non-volatile memory device

A flash memory device having a memory cell string is programmed. The flash memory device includes a plurality of memory cells. During a programming cycle, application of a program voltage to a channel region of the plurality of memory cells is delaying until after a gate of each of the memory cells of the plurality of memory cells that is to be programmed has reached a programming voltage Vpgm.

Flash memory devices and methods for programming the same

A flash memory device includes a plurality of data pads to receive data from an adjacent plurality of data pins. A signal generation circuit generates a plurality of selection signals responsive to bit organization and package signals. A buffer circuit buffers the data from the plurality of data pads. An input switch receives the data from the buffer circuit and transmits the data to the data lines responsive to the selection signals. And an output switch provides data to the buffer circuit responsive to the selection signals.

Growing community of inventors

Gyeonggi-do, South Korea

Oh-suk Kwon